C O M M U N I C A T I O N S
Table 1. Mobilities, On-Off Current Ratios and Threshold Voltages of Pyromellitic Diimides Based OTFTs Prepared by Vapor Depositiona
compounds
Ts (°C)
substrate treatment
µ (cm2 V-1 s-1
)
max µ (cm 2V- 1s-1
)
Vth (V)
on/off
no. devices tested
1
1
1
1
1
2
3
25
25
65
65
70
OTS
N
OTS
N
OTS
OTS
OTS
0.036 ( 0.001
0.004 ( 0.0004
0.055 ( 0.001
0.029 ( 0.001
0.070 ( 0.003
0.069 ( 0.004
0.023 ( 0.004
0.038 (0.025)
0.0045
0.056
18.1 (28.5)
18.6
14.9
105 (103)
104
12
8
4
106
0.030
29.2
106
4
0.074 (0.039)
0.079 (0.054)
0.030 (0.013)
22.4 (31.2)
14.4 (15.4)
13.7 (21.6)
106 (105)
106 (104)
105 (105)
14
16
7
115
25
a Values in parenthesis are measured in air. Ts, substrate temperature’ OTS, octadecyltrichlorosilane; N, no treatment; Vth, threshold voltage.
two reversible one-electron reductions, which are in agreement with
reported observations for pyromellitic diimide derivatives.9
In summary, a novel family of n-channel materials based on
pyromellitic diimide derivatives have been synthesized and fabri-
cated for organic field effect transistors. The field effect electron
mobility of these materials is found to be as high as 0.079 cm2/
(V.s). In addition, the on/off ratios of pyromellitic diimide based
transistors can reach a high value of 1 000 000. With its shorter
π-conjugation length, the pyromellitic diimides are relatively
transparent to visible light compared to naphthalene or perylene
tetracarboxylic diimides with the same side chain, which makes
them promising candidates for transparent electronics.
Figure 2. Current-voltage characteristics of 1 prepared by sublimation at
Acknowledgment. We are grateful to AFOSR (Award No.
substrate temperature of Ts ) 70 °C: (a) plot of Id versus Vd; (b) plot of
Id-sat versus Vg.
FA9550-06-01-0076) for support of this work.
Supporting Information Available: Details of synthesis, experiment
at substrate temperature of Ts ) 70 °C. Mobilities were calculated
procedures, DSC traces, UV-vis/electrochemical data for compound
1 and 3, X-ray diffraction graphs, AFM images, current-voltage
characteristics of 2 and crystallographic data of 1 in CIF format. This
from the saturation regime and fitted in the regions of highest slope,
and the results are listed in Table 1. Table 1 also lists a summary
of device performance of 1 deposited under some other conditions,
and of 2 and 3 deposited at 115 and 25 °C, respectively. The results
show that the charge carrier mobility for 1 increases when there is
a self-assembled OTS thin layer between the gate dielectrics and
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images, respectively (Supporting Information). The highest mobility
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°C, and with OTS surface treatment. For 2 we also achieved a high
mobility of 0.079 cm2/(V.s) and a on/off ratio of 106, when it was
deposited on the OTS-treated surface at 115 °C (Supporting
Information). All obtained film effect transistors can be operated
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Values in vacuum and in air were obtained from devices which
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when the devices resumed being operated in vacuum. Attempts to
improve mobilities, solubilities, and air stabilities are currently
underway through synthesis of further derivatives.
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