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was cooled at room temperature. If the stable gel was observed
at this stage, it was classied with CGC values (wt%) in Table 1.
4 N. M. Sangeetha and U. Maitra, Chem. Soc. Rev., 2005, 34,
821–836.
5 A. Ajayaghosh, V. K. Praveen and C. Vijayakumar, Chem. Soc.
Rev., 2008, 37, 109–122.
Gel–sol phase transition temperatures
6 A. R. Hirst, B. Escuder, J. F. Miravet and D. K. Smith, Angew.
Chem., Int. Ed., 2008, 47, 8002–8018.
7 D. K. Smith, Chem. Soc. Rev., 2009, 38, 684–694.
8 M.-O. M. Piepenbrock, G. O. Lloyd, N. Clarke and J. W. Steed,
Chem. Rev., 2010, 110, 1960–2004.
A sealed vial containing the gel was immersed in a thermostatic
dry bath. In 5 ꢀC increments, the sample vial was inverted and
Tgel was dened as the temperature at which gel–sol consistency
was observed.
9 A. Dawn, T. Shiraki, S. Haraguchi, S. Tamaru and S. Shinkai,
Chem.–Asian. J., 2011, 6, 266–282.
10 L. E. Buerkle and S. J. Rowan, Chem. Soc. Rev., 2012, 41,
6089–6102.
11 J. Raeburn, A. Z. Cardoso and D. J. Adams, Chem. Soc. Rev.,
2013, 42, 5143–5156.
12 G. Yu, X. Yan, C. Han and F. Huang, Chem. Soc. Rev., 2013,
42, 6697–6722.
TEM observations
TEM imaging was performed on a JEOL JEM-2010HCKM
instrument. The gel was prepared in a sample tube. For the TEM
measurements, the samples were obtained by dipping a carbon-
coated copper grid in the gel and dried under vacuum for more
than 12 h. The dried grid was negatively stained with 1%
phosphotungstic acid adjusted to pH 7 for 5 or 10 min. The
grids were washed with water and dried under vacuum for more
than 12 h. The TEM accelerating voltage was 200 kV.
13 K. Yoza, Y. Ono, K. Yoshihara, T. Akao, H. Shinmori,
M. Takeuchi, S. Shinkai and D. N. Reinhoudt, Chem.
Commun., 1998, 907–908.
SEM observations
14 J. Cui, A. Liu, Y. Guan, J. Zheng, Z. Shen and X. H. Wan,
Langmuir, 2010, 26, 3615–3622.
15 S. R. Jadhav, P. K. Vemula, R. Kumar, S. R. Raghavan and
G. John, Angew. Chem., Int. Ed., 2010, 49, 7695–7698.
16 G. Wang, H. Yang, S. Cheuk and S. Coleman, Beilstein J. Org.
Chem., 2011, 7, 234–242.
FE-SEM imaging was performed on a Hitachi SU-8000 instru-
ment at the Center of Advanced Instrumental Analysis, Kyushu
University. The xerogel of 1 was obtained by freezing and
pumping a gel of 1 for 5–14 h. The obtained xerogel was thus not
coated with metal. The SEM accelerating voltage was less than
0.5 kV.
17 A. Vidyasagar, K. Handore and K. M. Sureshan, Angew.
Chem., Int. Ed., 2011, 50, 8021–8024.
18 M. F. Abreu, V. T. Salvador, L. Vitorazi, C. E. N. Gatts,
D. R. dos Santos, R. Giacomini, S. L. Cardoso and
P. C. M. L. Miranda, Carbohydr. Res., 2012, 353, 69–78.
19 E. Bedini, L. Cirillo and M. Parrilli, Tetrahedron, 2013, 69,
1285–1296.
20 K. Yoza, N. Amanokura, Y. Ono, T. Akao, H. Shinmori,
M. Takeuchi, S. Shinkai and D. N. Reinhoudt, Chem.–Eur.
J., 1999, 5, 2722–2729.
AFM observations
AFM was performed on an SII NanoTechnology Inc. Nanonavi/
Nanocute instrument (now Hitachi High-Tech Science Corp.).
For the AFM measurements, a droplet of the solution of 2 or 6 at
0.02 wt% in toluene was placed on highly ordered pyrolytic
graphite (HOPG). Aer 1 h, the substrates were dried under
vacuum for more than 12 h.
21 O. Gronwald, K. Sakurai, R. Luboradzki, T. Kimura and
S. Shinkai, Carbohydr. Res., 2001, 331, 307–318.
22 O. Gronwald and S. Shinkai, J. Chem. Soc., Perkin Trans. 2,
2001, 1933–1937.
23 O. Gronwald and S. Shinkai, Chem.–Eur. J., 2001, 7, 4328–
4334.
XRD measurements
Powder XRD patterns were measured on a Rigaku RINT-TTR III
X-ray diffractometer equipped withꢁC1 uKa radiation (50 kV,
300 mA) at a scanning rate of 1ꢀ min
.
24 M. Mukai, H. Minamikawa, M. Aoyagi, T. Shimizu and
M. Hogiso, J. Colloid Interface Sci., 2000, 224, 154–160.
25 J. H. Jung, G. John, M. Masuda, K. Yoshida, S. Shinkai and
T. Shimizu, Langmuir, 2001, 17, 7229–7232.
26 J. H. Jung, S. Shinkai and T. Shimizu, Chem.–Eur. J., 2002, 8,
2684–2690.
Acknowledgements
We thank Dr Yumi Fukunaga for the support and valuable
advice regarding TEM observations and Mr Taisuke Matsumoto
for the support with XRD measurements. We thank Dr Osamu
Hirata and Dr Akihiro Tanaka for their valuable comments and
discussions.
27 S. Kiyonaka, S. Shinkai and I. Hamachi, Chem.–Eur. J., 2003,
9, 976–983.
28 M. Suzuki, M. Yumoto, M. Kimura, H. Shirai and
K. Hanabusa, Helv. Chim. Acta, 2004, 87, 1–10.
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25946 | RSC Adv., 2014, 4, 25940–25947
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