58
J. Braddock-Wilking et al. / Journal of Organometallic Chemistry 588 (1999) 51–59
Fig. 4. Partial molecular structure of (TMP)SiH3 (1), (TMP)2SiH2 (2), and (TMP)3SiH (3) showing the coordination environment around silicon
,
with the atom-labeling scheme, and nonbonded Si···O distances (A).
[2] J. Braddock-Wilking, M. Schiesher, L. Brammer, J. Huhmann,
R. Shaltout, J. Organomet. Chem. 499 (1995) 89.
[3] For recent reviews on penta- and hexacoordinated silicon com-
pounds see: (a) C. Chuit, R.J.P. Corriu, C. Reye, J.C. Young,
Chem. Rev. 93 (1993) 1371. (b) R.R. Holmes, Chem. Rev. 90
(1990) 17.
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1, JAI Press, Greenwich, CT, 1991, pp. 327.
[7] See for example: (a) F.T. Edelmann, Main Group Met. Chem.
17 (1994) 67. (b) F.T. Edelmann, Comments Inorg. Chem. 12
(1992) 259.
[8] (a) M. Wada, S. Higashizaki, A. Tsuboi, J. Chem. Res. (S)
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Chem. 319 (1987) C16.
Structure solution and refinement were carried out
using the SHELXTL-PLUS software package [26]. The
structures were solved by direct methods and refined
successfully in the space groups P21/n for 1 and 3 and
P21/c for 2. Full-matrix least-squares refinement was
carried out by minimizing S w(F2o−Fc2)2. The non-hy-
drogen atoms were refined anisotropically to conver-
gence. The hydrogen atoms were treated using
appropriate riding model (AFIX m3). The final residual
values and relevant structure refinement parameters are
listed in Table 4. Projection views of the molecules with
non-hydrogen atoms represented by 50% probability
ellipsoids and showing the atom labeling are presented
in Figs. 1–3. Complete listings of the atomic coordi-
nates, geometrical parameters and anisotropic displace-
ment coefficients for the non-hydrogen atoms,
positional and isotropic displacement coefficients for
hydrogen atoms are deposited with the Cambridge
Crystallographic Data Center (CCDC nos. 125736,
125737, 125738). A list of calculated and observed
structure factors is available in electronic format.
[11] E.A. Williams, in: S. Patai, Z. Rappoport (Eds.), The Chemistry
of Organic Silicon Compounds, vol. 8, Wiley, New York, 1989,
pp. 511.
Acknowledgements
[12] THF was generally used due to the cost and ease of purification.
The amount of (TMP)D formed (which represents the amount of
(TMP)Li formed) was based on mass spectral data using the
following equation: yield of (TMP)=[PD/(A+PD)]×100%
where PD is the intensity of the parent ion for (TMP)D (m/z=
169) and A is the residual protonated (TMP)H material. The
parameter A is defined as: A=(P−1)D−(P−1)H with the
subscripts referring to the deuterated (D) or protonated (H)
species. The (P−1) term refers to the (parent ion−1) peak in
the mass spectrum.
We thank the University of Missouri, St. Louis Re-
search Award for financial support, the National Sci-
ence Foundation and the University of Missouri, St.
Louis Center for Molecular Electronics for equipment
grants for The University of Missouri, St. Louis High
Resolution NMR Facility and X-ray Crystallography
Facility.
[13] C. Brelier, F. Carre, R.J.P. Corriu, M. Poirier, G. Royo, J.
Zwecker, Organometallics 8 (1989) 1831.
[14] C. Brelier, F. Carre, R.J.P. Corriu, G. Royo, M. Wong chi Man,
Organometallics 13 (1994) 307.
References
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[1] One of the first examples utilizing this approach was used for the
preparation of the stable disilene, Mes2SiꢁSiMes2 (Mes=2,4,6-
trimethylphenyl); R. West, M.J. Fink, J. Michl, Science 214
(1981) 1343.
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