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16 K. A. Rufanov, D. N. Zarubin, N. A. Ustynyuk, D. N. Gourevitch, J.
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Notes and references
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3 D. S. Williams, M. H. Schofield, D. E. Anhaus and R. R. Schrock, J.
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4 Selected references:(a) D. N. Williams, J. P. Mitchell, A. D. Poole, U.
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6 (a) M. P. Coles and V. C. Gibson, Polym. Bull., 1994, 33, 529; (b) M.
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30 A. A. Danopoulos, G. Wilkinson, T. K. N. Sweet and M. B. Hursthouse,
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32 Crystallographic data (excluding structure factors) have been deposited
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33 G. M. Sheldrick, SHELXS-97. Program for the Solution of Crystal
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35 Siemens Analytical X-ray Instruments Inc. SHELXTL 5.06 1995,
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36 M. N. Burnett, C. K. Johnson, ORTEP-III, Oak Ridge Thermal
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38 W. A. Wells, Structural Inorganic ChemistryOxdord University Press,
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