S. Qin et al.: Evaluation of weak interface effect on the residual stresses in layered SiC/TiC composites
TABLE II. Elastic modulus of the SiC + C interlayers.
Elastic modulus
8(g), and 8(i) is TiC particles. It can be seen that the
thickness of the SiC + C interlayer increases with
increasing graphite content because graphite is very
difficult to sinter at this sintering temperature. The inter-
layers are thin, straight, and uniform. Their thickness is
Materials
(GPa)
SiC
430
182
143
106
72
SiC + 50 wt%C
SiC + 60 wt%C
SiC + 70 wt%C
SiC + 80 wt%C
1
2
about 10–16 m, which is ⁄20 – ⁄25 of the SiC + TiC lay-
ers (except S10T).
Figure 9 shows the comparison between the stresses at
the center of the surface calculated by FEM and tested by
x-ray diffraction. In the SiC/S10T ceramic without inter-
layer, the calculated surface stress, −126 MPa, is very
close to the tested, −129 MPa. However, with increasing
graphite content in the interlayers, the decreasing rate in
the tested surface stress is faster than that in the calcu-
lated surface stress.
2
0
C
10
In the calculation of elastic modulus of the interlayer
according to the rule of mixtures, the interlayer was as-
sumed to be completely dense after sintering. However,
graphite is very difficult to sinter at this temperature, so
that the interlayers are porous [Figs. 8(c), 8(e), 8(g), and
8(i)]. So the elastic moduli of the interlayers used for
FEM calculation are higher than that in sintered materi-
als. Thus, the real relaxation effect of the interlayers on
the surface stress is larger than that for the calculated
results.
FIG. 7. Relaxation effects of the SiC + C interlayers on the xx dis-
tribution from point A to B in Fig. 4.
V. CONCLUSIONS
where 2 is the angle between the incident and diffracted
beams, and is the incident wavelength. From the elastic
strain, the corresponding stress can be calculated with the
aid of elastic constants appropriate for the hkl plane used.
A symmetrically layered SiC/S10T ceramic with
proper gradual thermal residual stress was designed by
FEM. It was found that, when different SiC + C inter-
layers containing 50 wt% C, 60 wt% C, 70 wt% C, and
80 wt% C were introduced into the layers to weaken the
interface, the interlayer had little relaxation effect on
the residual stress distribution of the designed SiC/S10T
ceramic by means of FEM calculation. These ceramics
were then fabricated by aqueous tape casting, stacking,
and hot-press sintering in argon atmosphere at 1850 °C
under 35 MPa for 30 min. After sintering, the interfaces
between the different layers in the layered SiC/S10T
ceramic without interlayer disappeared completely. The
interlayers were thin, straight, and uniform. Their thick-
In this work, Cr K radiation was used as the x-ray
␣
source. The penetration depth of the x-ray was less than
10 m. The (222) plane of SiC was selected as the dif-
fraction crystal face. Biaxial stress on the surface of the
specimens was assumed, and the stress along the length
direction of the specimens was tested. The widely rec-
2
ognized sin method was used, and measurements were
made at two values of 0° and 45°, corresponding to
2
sin values of 0 and 0.5. First, the surface stress of the
layered pure SiC ceramic was tested as a standard stress.
Then the surface stresses of the five layered SiC/S10T
ceramics were tested. The tested stress of each layered
SiC/S10T ceramic minus the standard stress was re-
garded as the surface thermal residual stress of the lay-
ered SiC/S10T ceramic.
1
2
ness was about ⁄20– ⁄25 of the SiC + TiC layers (except
S10T). The surface stress conditions of the ceramics
were tested by x-ray stress analysis. The tested surface
stress of the layered SiC/S10T ceramic without interlayer
was very close to FEM calculation. However, the real
relaxation effect of the SiC + C interlayer on the surface
compressive stress was much larger than the theoretical
results. The reason is that the interlayer was assumed to
be completely dense in the FEM model, but the real
interlayer in the sintered materials was porous, so the
selected elastic modulus of the interlayer for FEM cal-
culation was higher than the real elastic modulus.
IV. RESULTS AND DISCUSSION
Figure 8 shows the optical microstructures of the side
faces of the five ceramics. After sintering, the interfaces
between the different SiC + TiC layers in the layered
SiC/S10T ceramic without interlayer disappeared com-
pletely [Fig. 8(a)]. The light phase in Figs. 8(c), 8(e),
1
122
J. Mater. Res., Vol. 17, No. 5, May 2002
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