1
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L.R. Aramburo et al. / Journal of Catalysis 307 (2013) 185–193
material was calcined in a static oven (N100 Nabertherm) first pre-
heating it at 120 °C (30 min, 2 °C/min) and then increasing the
temperature to 550 °C (360 min, 10 °C/min). The steamed sample
was prepared treating H-ZSM-5-C in a quartz tubular oven (Therm-
oline 79300) during 180 min at 500 °C via saturation of a nitrogen
flow (180 ml/min) with water at 100 °C. Prior to steaming,
the sample was preheated at 120 °C (30 min, 2 °C/min). After the
hydrothermal treatment, the sample was calcined following the
same procedure as that described to obtain H-ZSM-5-C.
similarities in their spectra. During the measurements, the
monochromized X-ray beam was focused to a spot size of
35 Â 35 nm using a Fresnel Zone plate. The pixel size used in the
carbon K-edge STXM image sets was 35 nm.
In a second set of STXM experiments, ex-situ aluminum K-edge
measurements were done at beamline 10.ID.1 of the Canadian
Light Source (CLS, Saskatoon, Canada) using a 35 nm zone plate.
In every case, the samples were placed on silicon nitride windows
(100 nm thickness) and mounted perpendicular to the beam on a
piezoelectric stage. The aluminum stacks were recorded in the
1555–1590 eV range with an energy resolution of 0.15 eV and a
spatial resolution of 70 nm. Aluminum reference compounds were
measured performing a line scan along the samples with a dwell
time of 4 ms and an energy resolution of 0.15 eV. Normalization
and background correction was done subtracting to every spec-
trum a second spectrum obtained from an aluminum-free region.
The aluminum K-edge X-ray absorption spectra (XAS) of these ref-
erence compounds were used to perform a least squares linear
combination fitting of the aluminum stacks obtained from both
H-ZSM-5-C and H-ZSM-5-500. The STXM data files were analyzed
using aXis2000 software.
2.2. X-ray diffraction
X-ray diffraction (XRD) patterns were obtained at room temper-
ature from 5° to 90° 2h with a Bruker-AXS D8 Advance powder
X-ray diffractometer, equipped with an automatic divergence slit,
a Våntec-1 detector and a Cobalt K
.3. Nitrogen physisorption
a 1,2 (k – 1.79026 Å) source.
2
Nitrogen adsorption and desorption isotherms were measured
at À196 °C on a Micromeritics Tristar 3000 instrument.
In a third set of STXM experiments, pyridine adsorption exper-
iments were performed on the interferometrically controlled
microscope at beamline 11.0.2 of the Advanced Light Source
(ALS) at the Lawrence Berkeley National Laboratory (LBNL, Berke-
2.4. Catalytic testing
Catalytic testing experiments were performed on the powders
without pressing and sieving the two catalyst materials under study.
For each experiment, 30 mg of catalyst was placed in a fixed-bed
reactor, activated at 550 °C under oxygen for 1 h, and then cooled
to the reaction temperature (350 °C). The MTH reaction products
were analyzed with an online gas chromatograph (GC) connected
to the outlet of a fixed-bed reactor (i.d. 6 mm) using a heated transfer
line. The inlet of the reactor was connected to helium, which was
ley, USA) [9]. Prior to pyridine adsorption, 20 mg of zeolite sample
À3
was heated (170 °C) in a round-bottom flask under vacuum (10
-
mbar) for 60 min. Subsequently, the samples were prepared adding
0.2 l of pyridine (Acros Organics, 99%). After a waiting time of
l
60 min, pyridine was partially removed by heating the samples
at 400 °C for a period of 60 min. During the STXM experiments,
the samples were placed on silicon nitride windows (100 nm thick-
ness) and mounted perpendicular to the beam on a piezoelectric
stage. The monochromatized X-ray beam was focused to a spot size
of 25 Â 25 nm using a Fresnel zone plate. The absorption at the car-
bon K-edge was measured in the range of 280–310 eV collecting a
series of stacks with an energy resolution of 0.2 eV. After spatially
aligning the stack, PCA was used to obtain the primary components
in the data set. Subsequently, a cluster analysis was performed to
classify pixels according to statistical similarities in their spectra.
The pixel size used in the image sets was 30 nm.
bubbled through methanol kept at 20 °C (PMeOH = 130 mbar) in a sat-
À1 À1
uration evaporator (WHSV = 5.56 g g
h ).
To analyze the coke after reaction, 15 mg of the deactivated cat-
alyst samples was transferred into a Teflon tube where 1 ml of 15%
hydrofluoric acid was added. Subsequent to a waiting time of
3
0 min, 1 ml of dichloromethane, containing hexachloroethane as
the internal standard, was added to the Teflon tube. Then, 1 l of
l
the resulting organic phase was analyzed in an Agilent 6890N GC
equipped with an Agilent 5793 Mass Selective Detector. A HP-
5
0
MS column (60 m, 0.25 mm i.d., stationary phase thickness
.25 m) and an inlet split of 1:5 were used for this purpose.
l
2.6. Temperature-Programmed Desorption
2
.5. Scanning transmission X-ray microscopy
Temperature-Programmed Desorption (TPD) measurements
with ammonia as probe molecule were performed using a Microm-
eritics AutoChemII 2920 apparatus. The sample, 0.15 g in both
cases, was first pretreated in helium (25 ml/min) for 30 min at
600 °C, then cooled down to 100 °C, and saturated with ammonia
to its equilibrium state. Prior to desorption, samples were flushed
in helium for 30 min. Subsequently, ammonia desorption was per-
formed in the range of 100–600 °C at a heating rate of 10 °C/min.
In a first set of in situ STXM experiments, the MTH reaction was
performed on the interferometrically controlled STXM microscope
at the Pollux beamline of the Swiss Light Source (SLS, Villigen, Swit-
zerland) [8]. For this purpose, a Micro-Electro-Mechanical System
(
MEMS) nanoreactor was used to characterize the catalytic behav-
ior of the two zeolite H-ZSM-5 catalyst powders under study. Prior
to reaction, the samples were introduced inside the nanoreactor
and placed in an adaptor that can be translated with nanometer
precision by an interferometrically controlled (x,y,z) piezoelectric
stage. The samples were activated at 450 °C flowing helium (2 ml/
min) during 30 min. Then, the temperature was decreased to
2.7. Sputter depth profiling X-ray Photoelectron Spectroscopy
Sputter depth profiling X-ray Photoelectron Spectroscopy (XPS)
measurements were performed on a Physical Electronics Quantum
2000 Scanning X-ray Photoelectron Spectrometer or a Physical
Electronics Quantera X-ray photoelectron spectrometer. In either
3
50 °C, and methanol (Antonides-Interchema, 99%) was introduced
via saturation of helium flow (2 ml/min) at 0 °C for 400 min. During
reaction, the absorption at the carbon K-edge was analyzed at dif-
ferent times on stream collecting a series of images over small en-
ergy increments, subsequently combining these images to form a
spectral image sequence (stack). The stacks were obtained in the
range of 280–310 eV using an energy resolution of 0.2 eV. In a sec-
ond step, a Principal Component Analysis (PCA) and a cluster anal-
ysis were performed to classify pixels according to statistical
À9
instrument, the base pressure was kept ꢀ1 Â 10 mbar. The XPS
spectra were collected using monochromatic aluminum Ka radia-
tion (1486.6 eV). Charging was neutralized using the combined
low energy electron flood gun and low energy argon ion gun of
the instrument. Survey scans were collected using a pass energy
of 187 eV and region scans with a pass energy of 58 eV. For typical
measurements, H-ZSM-5 zeolites were deposited onto a vitreous