H. Chen et al.
Solid State Communications 275 (2018) 16–20
physical property measurement system (PPMS) with highest magnetic
field of 9 T. A standard four probes technique is applied to measure the
in-plane resistivity and the MR defined as ðρxxðB;TÞ ꢀ ρxxð0;TÞÞ=ρxxð0;TÞ.
Field and temperature dependent Hall resistance Rxy(B, T) measurements
were carried out using a six-probes method. Angle-dependent MRs
(ADMR) were measured using a rotation option of PPMS.
3. Results and discussion
3.1. XRD and EDX analysis of NbTe2
The single crystal samples were checked by XRD (Fig. 1(b)). The
strong diffraction peaks can be indexed as (00l), consistent with the
ICDD-PDF 21-0605. Fig. 1(a) presents the crystal structure of 1T0-NbTe2
(Space group C2/m (No. 12), Z ¼ 6, a ¼ 19.39 Å, b ¼ 3.642 Å,
c ¼ 9.375 Å, β ¼ 134.58ꢁ) [11]. The single crystals are brittle and can be
easily cleaved along (001) plane. The layered characteristics can be
found in the SEM image showing thin platelets. The cleaved plane is flat
and clean without any iodine trace left as supported by EDX data of
Fig. 1(c). The EDX indicated the composition of Nb:Te ¼ 35:65, in well
agreement with the ratio of chemical stoichiometry of NbTe2. According
to the experimental data of XRD and the EDX analysis, we confirmed the
crystals are NbTe2.
3.2. Magneto-transport properties of 1T0-NbTe2
We measured the temperature-dependent resistivity of several sam-
ples from different batches and found the residual resistance ratio
(RRR ¼ ρxxð300 KÞ=ρxxð3 KÞ) values are in the range of 10–20. We chose
the sample with RRR~20 to study its magneto-transport properties in
detail. The resistivity of NbTe2 is 115.5 μΩ cm at 300 K, and 5.8 μΩ cm at
3 K. The in-plane resistivity ρxx (0, T) (Fig. 2(a)) shows a typical metallic
behaviour. A small thermal hysteresis is observed near room temperature
between the cooling and warming cycles with a rate of 5 K/min. Hall
resistances at different temperatures are shown in Fig. 2(b). All the Hall
resistances show a positive linear dependence on magnetic field B, which
indicates that almost no carrier concentration changed with increasing
field and the dominant charge carriers in NbTe2 are holes, similar to that
in TaTe2. The Hall coefficient, RH
increasing temperature, which is opposite to LT-TaTe2. The net carrier
¼
d
ρxyðBÞ=dB, increases with
Fig. 1. (a) Schematical crystal structures of 1T-NbTe2 and 1T0-NbTe2. The solid
lines indicate the unit cells. (b) X-ray diffraction pattern of a TaTe2 single crystal
measured at room temperature. Inset: an optical image of typical single crystals
from different batches. (c) The energy spectrum data of a cleaved sample sur-
face. Inset: SEM morphology of a cleaved NbTe2 sample surface. The square
indicates the analyzed zone of EDX analysis on a sample surface.
concentration is given by ðnh ꢀ neÞ ¼ 1=ðeRHÞ and the carrier mobility is
given by
μ
¼ RH=ρxx. The carrier concentration ðnh ꢀ neÞ and mobility
both decrease with increasing temperature as shown in Fig. 2(c). The net
carrier concentration ðnh ꢀ neÞ is about 1.7 ꢂ 1021 cmꢀ3 and the mobility
is about 607 cm2/(V s) at 3 K.
The transverse MRs versus magnetic field at low temperatures are
presented in Fig. 3(a). A relatively large MR reached 30% was observed
under a 9 T field at 3 K and did not show any signs of saturation in
measured field range. A crossover of MRs from a semi-classical weak-
field B2 dependence to a nearly linear B dependence was observed when
the magnetic field is beyond a critical field B*. In order to determine the
critical field B*, the differential MR versus field, dMR/dB, is plotted as
shown in Fig. 3(b) dMR/dB is linearly proportional to B with a large
positive slope in low fields, but reached a much reduced slope when field
is higher than B* (B*~1.85 T at 3 K), which is determined by an inter-
section of two linear fitting lines (as shown by the guide lines in
Fig. 3(b)). The critical field shifts to a higher field with increasing tem-
perature, as shown in Fig. 3(c). The dependence of the critical field B* on
temperature is shown with blue square in Fig. 3(d), which can be well
helpful to reveal the electronic structure evolution with CDW transitions
in NbTe2 and TaTe2.
2. Material and methods
Single crystals of NbTe2 were grown by an improved chemical vapor
transport (CVT) method [21,22]. Niobium foil (99.99%), Te powder
(99.99%), and little amount of iodine (99%) were loaded into an evacuated
silica tube in cross section diameter of 1 cm and long 15 cm. The tube was
heated in a two-zone furnace at 550 ꢁC for 1 day, and then rise the tem-
perature to 850 ꢁC at the hot end and 750 ꢁC at the cool end. Maintaining
this temperature gradient for one week and then cooled naturally, crystals
with metal luster were obtained (See the inset of Fig. 1(b)) at the cool end.
The crystals are usually thin platelets oriented along [001] or long ribbons,
and over half centimeters in at least one dimension. The composition of the
prepared NbTe2 sample was checked by energy-dispersive x-ray analysis
(EDX). X-ray diffraction (XRD) pattern was collected using a PANalytical
X'Pert PRO diffractometer with Cu radiation.
2
fitted with the red solid curve satisfying B* ¼ ð1=2eℏvF2ÞðEF þ kBTÞ with
vF ꢃ 5.7(3) ꢂ 104 m/s and EF ꢃ 8.2(3) meV. The critical field dependence
on temperature suggested the existence of electronic band with linear
dispersion [23] in 1T0-NbTe2 and will be discussed in the following.
From the Hall resistance measurements, the carrier concentration of
NbTe2 can be deduced to be in the order of 1020~1021 cmꢀ3, which is
The resistivity measurements were performed on a Quantum Design
17