Communications
implies that in reactions with light, water splitting accounts for
of more than 15 wt% for our experiments within the temper-
ature range of the standard conditions.[13]
over 96% of hydrogen evolution. It is especially interesting
that, upon aging, the catalyst becomes more stable toward
thermal decomposition and produces less hydrogen according
to Equation (1), as shown in Figure 4.
We favor the idea that in the present reactions with the
TiSi2-derived catalyst, water-solubilized dioxygen leaves the
catalytic centers (cc1) after photolytic water oxidation and is
photoadsorbed at the original thin-layered TiO2 sites (2–5 nm
thick) at the surface of the catalyst (see XRPD and XP
spectroscopy below). In this way, ionic columns of oxygen are
formed, which might be held together by charge transfer, and
from which O2 can be released upon thermal activation in the
dark.
A technically valuable aspect of TiSi2 is its capacity for
reversible physical hydrogen storage. Approximately
20 mLH2 gꢀ1 TiSi2 can be physisorbed at 308C and 5–
7 mLH2 gꢀ1 TiSi2 at 508C. This storage capacity, while lower
than those found for other inorganic materials that form
metal hydrides, is technically less demanding and requires
lower reaction temperatures for desorption of hydrogen.[19]
In routine runs at temperatures below 1008C, only
hydrogen is found in the gas phase, and dioxygen does not
appear. Also, hydrogen peroxide is detected in neither the gas
nor the liquid phase. In fact, oxygen is efficiently photo-
adsorbed by the catalyst in light and at any temperature.
Conveniently, it is desorbed under very different conditions
than hydrogen, thus allowing easy separation of the two gases.
Quantitative (within the experimental error of ꢁ 15%)
release of dioxygen sets in rapidly when reaction slurries
are heated to ꢂ 1008C in the dark(see Figure 2 and the
Supporting Information, Figure 7); these and further results
are summarized in Table 1. An H2/O2 stoichiometric ratio of
2:1 results in phase B of the reactions, while the initial thermal
hydrogen evolution in phase A ceases (max. 12–16 mL, see
footnote [g] runs 2–5 in Table 1). Notably, this result
exemplifies for the first time efficient and controlled desorp-
tion of physisorbed dioxygen from a semiconductor surface at
a temperature as low as 1008C.[20a]
Water splitting was additionally demonstrated by irradi-
ation under standard conditions but with 10% H218O-
enriched water to give fractions of 18O2 and 16O18O besides
16O2 in the gas phase after desorption, as determined by mass
spectrometry. The measurements revealed 18O isotope enrich-
ment in a ratio of 16O2/16O18O = 43 (theoretical value: 4.5 for
10% enrichment) as compared to the theoretical natural ratio
of 249 in air (see Figure 8 in the Supporting Information). A
more precise result is difficult to reach, because air leakage is
hard to avoid.[13] Moreover, a carbon dioxide signal with
varying intensity has been recorded (inset in Figure 8); the
origin of the carbon is, however, unclear at present.[13]
X-ray powder diffraction (XRPD) and X-ray photoelec-
tron spectroscopy (XPS) revealed structural changes of TiSi2
in water and upon irradiation. The two methods are
complementary since XRPD mainly analyzes the crystalline
phases of the bulkmaterial, whereas information about the
chemical composition of the surface is provided by XPS. An
average sample of TiSi2 shows 80% crystalline and 20%
amorphous phases as determined by XRPD. The major
component of the samples is TiSi2. Both composite regions of
the TiSi2 are covered in part by a thin oxide layer, and even
after extended reaction times Ti0 and Si0 domains remain
detectable by XPS. The oxide layers and domains, as
measured for both titanium and silicon by XPS after sputter-
ing, are limited to a few molecular layers in depth.
The XRPD pattern of a sample which has run for 1000 h at
608C under standard conditions shows several crystalline
phases[23] (Figure 9 in Supporting Information) and is
unchanged as compared to a sample analysis of starting
TiSi2. Main crystalline components are TiSi2, followed by TiSi
and metallic Si and Ti. No reflections belonging to SiO2 or
TiO2 phases are visible.
A different view is given by the XPS data. After removing
the oxide layer gradually by sputtering, the contribution of
metallic components to the surface is significantly increased.
After more than 10 min of sputtering with Ar+ ions, the ratio
of oxidized to metallic species stabilizes. The spectra in
Figure 5 represent the Ti 2p photopeaks before sputtering of
the sample and after different times of sputtering (Figure 5a)
and the corresponding Si 2p peaks (Figure 5b). Both spectra
measured before sputtering show that a thin surface layer is
highly oxidized. Only small photopeaks belonging to the
Table 1: Gas evolution under standard conditions (in mL) at various
reaction times and in separate runs. The gas volumes are given in mL.
[a]
[b]
[c]
[d]
Run
H2
H2
H2
O2
a
b=mL O2 2
c=aꢀb
1[e]
2
3
6
24
40
42
112
<6
10
24
30
96
<6
<3[h,i]
5[i]
14[g]
16[g]
12[g]
16[g]
12[i]
15[i]
48[i]
4
5[f]
[a] Total in gas phase. [b] From water splitting according to Equations (2)
and (3). [c] Thermal from Equation (1). [d] Evolved from storage. Gas
phase plus less than 3 mL dissolved in water. [e] See the Supporting
Information, Figure 7. [f] See Figure 2. [g] In these reactions no further
measurable thermal hydrogen evolution is found, that is, these values
remain constant within an error limit of ꢁ15%. [h] Below the detection
limit in gas phase. [i] Desorption at ꢂ1008C in the dark.
With this background, it is of interest to compare our
results with a recent study of the adsorption of oxygen in the
course of its assumed photoreduction at a TiO2 surface. The
study employed ab initio calculations based on infrared
data.[21] In that work, it was concluded that desorption of
(ionized) oxygen should be hardly possible from the surface
of such a gas–solid system. Another investigation in line with
our findings found a high storage capacity of TiO2 for oxygen
(ca. 25 wt%);[20b] an equilibrium between TiO2 and a lower
ꢀ
intermetallic Ti Si compounds are visible. The pattern
reveals no noticeable structural changes of the catalyst even
after extended reaction times.
oxide is proposed as an oxygen trap in analogy to CeO2.[22]
A
From the XRPD experiments we know that no crystalline
oxides are present. On the other hand, the XPS data clearly
preliminary determination found an oxygen storage capacity
7772
ꢀ 2007 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim
Angew. Chem. Int. Ed. 2007, 46, 7770 –7774