Recently, anodic porous alumina films with various pore diam-
eters have been successfully fabricated by controlling anodization
conditions and by applying a retexturing process using molds.13
But, these systems, we think, cannot be extended to general
synthetic methodology as easily as surfactant-templated systems
can, because it is difficult to finely control pore diameters and
film thicknesses in a nanometre scale. In the surfactant-templated
system, the pore sizes are controllable by changing surfactant sizes,
while the film thicknesses are controllable by changing concentra-
tions of inorganic species in precursor solutions. The used methods
(e.g., spin-coating, dip-coating, and casting methods) also greatly
affect the film thicknesses. Such a bottom-up approach by using
self-assembled surfactants is a versatile route to a wide range of
pore sizes, pore spacings, and compositions of pore walls.
7 (a) J. Schaep, C. Vandecasteele, B. Peeters, J. Luyten, C. Dotremont and
D. Roels, J. Membr. Sci., 1999, 163, 229; (b) Z. Zhang, R. W. Hicks, T.
R. Pauly and T. J. Pinnavaia, J. Am. Chem. Soc., 2002, 124, 1592; (c) H.
C. Lee, H. J. Kim, C. H. Rhee, K. H. Lee, J. S. Lee and S. H. Chung,
Microporous Mesoporous Mater., 2005, 79, 61; (d) J. C. Ray, K.-S. You,
J.-W. Ahn and W.-S. Ahn, Microporous Mesoporous Mater., 2007, 100,
183; (e) J. H. Kwak, J. Hu, D. Mei, C.-W. Yi, D. H. Kim, C. H. F. Peden,
L. F. Allard and J. Szanyi, Science, 2009, 325, 1670.
8 (a) K. Niesz, P. Yang and G. A. Somorjai, Chem. Commun., 2005,
1986; (b) Q. Yuan, A. X. Yin, C. Luo, L. D. Sun, Y. W. Zhang, W. T.
Duan, H. C. Liu and C. H. Yan, J. Am. Chem. Soc., 2008, 130, 3465;
(c) C. Boissie`re, L. Nicole, C. Gervais, F. Babonneau, M. Antonietti, H.
Amenitsch, C. Sanchez and D. Grosso, Chem. Mater., 2006, 18, 5238;
(d) W. Cai, J. Yu, C. Anand, A. Vinu and M. Jaroniec, Chem. Mater.,
2011, 23, 1147; (e) Q Liu, A Wang, X Wang and T Zhang, Chem. Mater.,
2006, 18, 5153; (f) Z. Wu, Q. Li, D. Feng, P. A. Webley and D. Zhao, J.
Am. Chem. Soc., 2010, 132, 12042; (g) P. F. Fulvio, R. I. Brosey and M.
Jaroniec, ACS Appl. Mater. Interfaces, 2010, 2, 588; (h) S. M. Morris,
J. A. Horton and M. Jaroniec, Microporous Mesoporous Mater., 2010,
128, 180; (i) S. M. Morris, P. F. Fulvio and M. Jaroniec, J. Am. Chem.
Soc., 2008, 130, 15210.
Acknowledgements
9 (a) M. Ogawa, J. Am. Chem. Soc., 1994, 116, 7941; (b) M. Ogawa, Chem.
Commun., 1996, 1149; (c) I. A. Aksay, M. Trau, S. Manne, I. Honma, N.
Yao, L. Zhou, P. Fenter, P. M. Eisenberger and S. M. Gruner, Science,
1996, 273, 892; (d) H. Yang, A. Kuperman, N. Coombs, S. Mamiche-
Afara and G. A. Ozin, Nature, 1996, 379, 703; (e) Y. F. Lu, R. Ganguli,
C. A. Drewien, M. T. Anderson, C. J. Brinker, W. L. Gong, Y. X. Guo,
H. Soyez, B. Dunn, M. H. Huang and J. I. Zink, Nature, 1997, 389,
364.
We would like to give special thanks to Prof. Dr Yasuhiro
Sakamoto (Osaka Prefecture University, Japan) for his valuable
advice on cross-sectional TEM images.
Notes and references
10 (a) M. Kuemmel, D. Grosso, C. Boissie`re, B. Smarsly, T. Brezesinski,
P. A. Albouy, H. Amenitsch and C. Sanchez, Angew. Chem., Int. Ed.,
2005, 44, 4589; (b) L. Wan, H. Fu, K. Shi and X Tian, Microporous
Mesoporous Mater., 2008, 115, 301.
11 (a) P. C. A. Alberious, K. L. Frindell, R. C. Hayward, E. J. Karmer,
G. D. Stucky and B. F. Chmelka, Chem. Mater., 2002, 14, 3284; (b) D.
Grosso, G. J. de A. A. Soler-Illia, E. L. Crepaldi, F. Cagnol, C. Sinturel,
A. Bourgeois, A. Brunet-Bruneau, H. Amenitsch, P. A. Albouy and C.
Sanchez, Chem. Mater., 2003, 15, 4562; (c) C. W. Wu, T. Ohsuna, M.
Kuwabara and K. Kuroda, J. Am. Chem. Soc., 2006, 128, 4544; (d) C.
W. Wu, Y. Yamauchi, T. Ohsuna and K. Kuroda, J. Mater. Chem., 2006,
16, 3091.
1 (a) T. Yanagisawa, T. Shimizu, K. Kuroda and C. Kato, Bull. Chem.
Soc. Jpn., 1990, 63, 988; (b) T. Yanagisawa, T. Shimizu, K. Kuroda and
C. Kato, Bull. Chem. Soc. Jpn., 1990, 63, 1535.
2 (a) C. T. Kresge, M. E. Leonowicz, W. J. Roth, J. C. Vartuli and J. S.
Beck, Nature, 1992, 359, 710; (b) J. S. Beck, J. C. Vartuli, W. J. Roth, M.
E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson,
E. W. Sheppard, S. B. Mccullen, J. B. Higgins and J. L. Schlenker, J.
Am. Chem. Soc., 1992, 114, 10834.
3 Y. Wan and D. Zhao, Chem. Rev., 2007, 107, 2821.
4 (a) P. Yang, D. Zhao, D. I. Margolese, B. F. Chmelka and G. D. Stucky,
Nature, 1998, 396, 152; (b) G. J. de A. A. Soler-Illia, C. Sanchez, B.
Lebeau and J. Patarin, Chem. Rev., 2002, 102, 4093; (c) J. Fan, S. W.
Boettcher and G. D. Stucky, Chem. Mater., 2006, 18, 6391.
5 (a) T. Yamashita, D. L. Lu, J. N. Kondo, M. Hara and K. Domen,
Chem. Lett., 2003, 32, 1034; (b) K. Nakajima, M. Hara, K. Domen
and J. N. Kondo, Chem. Lett., 2005, 34, 394; (c) Y. Noda, B. Lee, K.
Domen and J. N. Kondo, Chem. Mater., 2008, 20, 5361; (d) J. N. Kondo
and K. Domen, Chem. Mater., 2008, 20, 835.
12 H. K. M. Tanaka, Y. Yamauchi, T. Kurihara, Y. Sakka, K. Kuroda and
A. P. Mills Jr., Adv. Mater., 2008, 20, 4728.
13 (a) T. Kondo, K. Nishio and H. Masuda, Jpn. J. Appl. Phys., 2010,
49, 025002; (b) T. Kondo, K. Nishio and H. Masuda, Chem. Lett.,
2010, 39, 238; (c) T. Yanagishita, K. Nishio and H. Masuda, Jpn. J.
Appl. Phys., 2010, 49, 065202; (d) T. Yanagishita, K. Nishio and H.
Masuda, Chem. Lett., 2010, 39, 188; (e) M. Harada, T. Kondo, T.
Yanagishita, K. Nishio and H. Masuda, Appl. Phys. Express, 2010, 3,
015001; (f) T. Yanagishita, E. Endo, Y. Yamaguchi, K. Nishio and H.
Masuda, Chem. Lett., 2009, 38, 274; (g) T. Yanagishita, K. Nishio and
H. Masuda, Appl. Phys. Express, 2009, 2, 022001; (h) T. Kondo, K.
Nishio and H. Masuda, Appl. Phys. Express, 2009, 2, 032001.
6 (a) D. S. Kim and S. Y. Kwak, Environ. Sci. Technol., 2009, 43, 148;
(b) T. Kimura, Y. Yamauchi and N. Miyamoto, Chem.–Eur. J., 2010,
16, 12069; (c) H. Oveisi, S. Rahighi, X. Jiang, Y. Nemoto, A. Beitollahi,
S. Wakatsuki and Y. Yamauchi, Chem.–Asian J., 2010, 5, 1978; (d) J.
N. Kondo, T. Yamashita, K. Nakajima, D. L. Lu, M. Hara and K.
Domen, J. Mater. Chem., 2005, 15, 2035.
10856 | Dalton Trans., 2011, 40, 10851–10856
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