APPLIED PHYSICS LETTERS
VOLUME 76, NUMBER 18
1 MAY 2000
Field emission from molybdenum carbide
Ambrosio A. Rouse, John B. Bernhard, Edward D. Sosa, and David E. Goldena)
Department of Physics and Material Science, University of North Texas, Denton, Texas 76203
͑Received 23 November 1999; accepted for publication 13 March 2000͒
The thermal stability and the resiliency of molybdenum carbide field-emission tips deposited at
room temperature by electrophoresis have been studied. The field emission from Mo2C films
deposited on Mo tips does not change after being heated to 800 °C while exposed to 360 L of air,
although MoO2, MoO3, and possibly MoO, are present in the films. The field-emission thresholds
agree with photoelectric work functions determined from photoelectron spectroscopy measurements
of similarly grown flat samples. These films are found to exist in three distinct phases as a function
of temperature after formation by room-temperature electrophoresis. From room temperature to
500 °C, MoO3 is the dominant oxide, from 500 to 775 °C, MoC2 is the dominant oxide, and above
825 °C both oxides have virtually disappeared. © 2000 American Institute of Physics.
͓S0003-6951͑00͒04218-2͔
Cold high-brightness electron sources have been made
using molybdenum field-emission arrays ͑FEAs͒ based on
micron-sized field emitters deposited using the Spindt depo-
sition process.1 Molybdenum has been the emitter material of
choice for FEAs because it has good thermal, mechanical,
and electrical properties and easy to achieve high-aspect
ratios.2 However, when molybdenum emitters are exposed to
oxygen, they easily form insulating molybdenum oxides that
degrade the emission.3 In fact, when a Mo FEA was exposed
to 10 L of O2, the work function of the FEA increased by 0.3
eV and when exposed to 100 L of O2, its work function
increased by 0.6 eV. This corresponded to a decrease in
emission current of 17% for 10 L exposure and 50% for 100
L at the 60 V operating voltage.3
determined from FE energy distribution measurements and
compared to ultraviolet photoelectron spectroscopy ͑UPS͒
measurements using similarly coated flat samples. These
samples also have been studied using x-ray photoelectron
spectroscopy ͑XPS͒ and x-ray diffraction ͑XRD͒ as a func-
tion of annealing.
FE tips were fabricated from 0.02-in.-thick molybdenum
wire that was electrochemically etched in a 2 mol % KOH
solution using a ϩ10 V bias voltage on the wire and then
rinsed in distilled water. Molybdenum carbide powder
͑99.5%͒ of 3–4 m average size was mixed in an aqueous
solution of 10% ethanol and used to deposit molybdenum
carbide via electrophoresis8 on the tips and molybdenum
foils at room temperature by applying a ϩ240 V bias to the
sample for 10 min.9
Molybdenum carbide has a density, hardness, melting
point, coefficient of thermal expansion, and conductivity
similar to that of molybdenum,4 and could also be used to
make Spindt FEAs. Molybdenum carbide has a work func-
tion of 3.8 eV,5 which is considerably lower than that of
molybdenum with a work function of 4.6 eV,6,7 but it has not
been investigated as a potential field emitter material.
In the present work, field emission ͑FE͒ from molybde-
num carbide-coated field-emission tips has been studied in a
single gated-diode configuration before and after exposure to
air at 10Ϫ7 Torr and temperatures as high as 800 °C. Fowler–
Nordheim FE current–voltage characteristics and simulta-
neous FE energy distributions ͑FEEDs͒ were obtained from
tips mounted in a gated-diode configuration in the analysis
chamber of a VG-ESCALAB system. In a Fowler–
Nordheim plot, the natural log of the ratio of current to volt-
age squared (I/V2) is plotted versus 1/V. The slope of the
resulting straight line yields the product of the work function
of the surface to the 3/2 power times the ‘‘tip-shape param-
eter.’’ Since the work function may be directly measured
with a FEED, a straight-line current–voltage characteristic
insures that the tip-shape function did not change during the
FEED measurement.
Flat samples were processed in a chamber attached to a
VG ESCALAB II system over a temperature range from 26
to 900 °C in 1 h intervals at an average base pressure of 1
ϫ10Ϫ7 T of air. Additional samples were annealed at 412,
525, and 800 °C in 1 h intervals at an average base pressure
of 10Ϫ7 T of air. All samples were characterized with XPS
before and after each annealing stage and with scanning elec-
tron microscope ͑SEM͒ micrographs taken with a JEOL
JMS-T300 before processing and analysis, and after analysis.
Low-energy ͑4.49, 5.06, and 5.64 eV͒ UPS data with a Xe
UV source and 2 nm bandpass monochromator also were
obtained. UPS and XPS data were analyzed with the PEAKFIT
program using Gaussian profiles.10 XRD was obtained with a
Siemens D500 diffractometer using Cu K␣1 radiation.
The XRD result for Mo2C deposited on a flat Mo sheet is
given in Fig. 1 and corresponds to hexagonal Mo2C.11 The
three major Mo2C peaks found in Mo2C powder are clearly
seen. In addition, the intense Mo ͑200͒ peak drops by a fac-
tor of 2.5 after Mo2C deposition, indicating good Mo2C cov-
erage. A slight shift of the diffraction lines toward lower 2
angles between the deposited samples and the Mo2C powder
was seen, indicating lattice expansion. This is likely due to
oxygen substitution for carbon, as previously reported.12
This stress was relieved with increasing annealing tempera-
ture. Finally, the MoO3 ͑002͒, ͑200͒, and ͑101͒ planes are
Molybdenum carbide-coated tip FE thresholds have been
a͒
Electronic mail: golden@unt.edu
0003-6951/2000/76(18)/2583/3/$17.00 2583 © 2000 American Institute of Physics
129.12.234.99 On: Mon, 15 Dec 2014 01:15:23