K50
Journal of The Electrochemical Society, 157 ͑3͒ K47-K51 ͑2010͒
direct control of the CNT diameter and density through the catalyst
deposition step as well as a selective placement of the catalyst. Both
are important steps toward the device integration and the demonstra-
tion of potential CNT applications.
Acknowledgments
This work was partly supported by the EU projects CARBon-
CHIP ͑NMP4-CT-2006-016475͒, SEA-NET Pro-Nano ͑IST-
027982͒, and METACEL project ͑IWT-SBO project 060031͒,
funded by IWT-Vlaanderen. The authors thank Hefin Griffiths of
Oxford Instruments Plasma Technologies U.K. for the experiments
in their PECVD reactor, and Hugo Bender and Olivier Richard of
IMEC for the HRTEM.
IMEC assisted in meeting the publication costs of this article.
References
1. S. Iijima, Nature (London), 354, 56 ͑1991͒.
2. V. N. Popov, Mater. Sci. Eng. R., 43, 61 ͑2004͒.
3. R. H. Baughman, A. A. Zakhidov, and W. A. de Heer, Science, 297, 787 ͑2002͒.
4. P. G. Collins and P. Avouris, Sci. Am., 283, 62 ͑2000͒.
5. F. Kreupl, A. P. Graham, G. S. Duesberg, W. Steinhogl, M. Liebau, E. Unger, and
W. Honlein, Microelectron. Eng., 64, 399 ͑2002͒.
6. W. Hoenlein, Jpn. J. Appl. Phys., Part 1, 41, 4370 ͑2002͒.
7. N. Srivastava, R. V. Joshi, and K. Banerjee, in IEEE/IEDM, IEEE, p. 257 ͑2005͒.
8. M. Nihei, D. Kondo, A. Kawabata, S. Sato, H. Shioya, M. Sakaue, T. Iwai, M.
Ohfuti, and Y. Awano, in Proceedings of IEEE/IITC, IEEE, p. 234 ͑2005͒.
9. S. Maruyama, R. Kojima, Y. Miyauchi, S. Chiashi, and M. Kohno, Chem. Phys.
Lett., 360, 229 ͑2002͒.
10. S. Hofmann, B. Kleinsorge, C. Ducati, A. C. Ferrari, and J. Robertson, Diamond
Relat. Mater., 13, 1171 ͑2004͒.
11. M. Cantoro, S. Hofmann, S. Pisana, V. Scardaci, A. Parvez, C. Ducati, A. C.
Ferrari, A. M. Blackburn, K. Y. Wang, and J. Robertson, Nano Lett., 6, 1107
͑2006͒.
12. G. Zhang, D. Mann, L. Zhang, A. Javey, Y. Li, E. Yenilmez, Q. Wang, J. P.
McVittie, Y. Nishi, J. Gibbons, et al., Proc. Natl. Acad. Sci. U.S.A., 102, 16141
͑2005͒.
13. M. Hu, Y. Murakami, M. Ogura, S. Maruyama, and T. Okubo, J. Catal., 225, 230
͑2004͒.
14. J. Li, Q. Ye, A. Cassell, H. T. Ng, R. Stevens, J. Han, and M. Meyyappan, Appl.
Phys. Lett., 82, 2491 ͑2003͒.
15. S. Sato, M. Nihei, A. Mimura, A. Kawabata, D. Kondo, H. Shioya, T. Iwai, M.
Mishima, M. Ohfuti, and Y. Awano, in Proceedings of IEEE/IITC, IEEE, p. 204
͑2007͒.
Figure 4. ͑Color online͒ ECD nickel nanoparticles selectively deposited
inside via patterns at Ϫ1.5 V vs Ag/AgCl for 0.1 s: ͑a͒ SEM cross section of
150 and 300 nm vias from dense arrays; ͑b͒ top view SEM images showing
similar particle density and size in 150 and 300 nm isolated ͑pitch/diameter
of 8͒ and dense ͑pitch/diameter of 2͒ arrays; ͑b.1͒ 2.3 ϫ 1011 cm−2
15 Ϯ 7 nm; ͑b.2͒ 2.0 ϫ 1011 cm−2, 17 Ϯ 5 nm; ͑b.3͒ 2.4 ϫ 1011 cm−2
15 Ϯ 3 nm; and ͑b.4͒ 2.3 ϫ 1011 cm−2, 14 Ϯ 3.5 nm.
,
,
16. T. Iwasaki, R. Morikane, T. Edura, M. Tokuda, K. Tsutsui, Y. Wada, and H.
Kawarada, Carbon, 45, 2351 ͑2007͒.
17. S. Hermann, R. Ecke, S. Schulz, and T. Gessner, Microelectron. Eng., 85, 1979
͑2008͒.
18. S. Sato, A. Kawabata, M. Nihei, and Y. Awano, Chem. Phys. Lett., 382, 361
͑2003͒.
19. S. Sato, A. Kawabata, D. Kondo, M. Nihei, and Y. Awano, Chem. Phys. Lett., 402,
149 ͑2005͒.
ties of the patterned structures compared to larger features and blan-
ket substrates. The need for a longer pretreatment step for efficient
catalyst activation is most probably due to the profile of the pat-
terned substrates as it may hinder the plasma activation, especially
in the smaller cavities.
The growth rate was independent of catalyst activation time pro-
vided that the particles were sufficiently activated. About 1 m
long CNT bundles were grown after a 30 s exposure to 100 sccm
acetylene at 1 Torr and at 650°C in the 300 nm dense and isolated
vias for both the 5 and 10 min pretreatment conditions. For the 5
min pretreatment condition, increasing the growth time to 1 min
resulted in twice as long tubes with similar densities ͑i.e., linear
growth rate of 33 nm s−1 for the first minute͒. After 10 min of
growth ͑as shown in Fig. 3b͒, 6 m long aligned tubes had grown
out of the vias, which was about half of the length obtained on the
blankets. Moreover, unlike the CNT bundles grown out of the vias,
the CNT part that was still inside the vias now showed a disordered
and defective morphology. As a tip growth process was observed
and the quality of the CNT inside the vias was fine at short growth
times, the damage after such long growth times must have been
introduced after the growth. Indeed, a significant increase in the TiN
surface roughness was observed at these high temperatures after
annealing the substrate. At this point, it is not completely clear what
causes this postgrowth damage; however, changes in the substrate
morphology could be one explanation.
20. G. Oskam, J. G. Long, A. Natarajan, and P. C. Searson, J. Phys. D: Appl. Phys.,
31, 1927 ͑1998͒.
21. Y. Tu, Z. P. Huang, D. Z. Wang, J. G. Wen, and Z. F. Ren, Appl. Phys. Lett., 80,
4018 ͑2002͒.
22. D. Liu, J. Chen, W. Deng, H. Zhou, and Y. Kuang, Mater. Lett., 58, 2764 ͑2004͒.
23. M. Tamura, Y. Kemmochi, Y. Murakami, N. Chino, M. Ogura, S. P. Naik, M.
Takai, Y. Tsuji, S. Maruyama, and T. Okubo, Appl. Phys. A: Mater. Sci. Process.,
84, 247 ͑2006͒.
24. Y. Xia, P. Yang, Y. Sun, Y. Wu, B. Mayers, B. Gates, Y. Yin, F. Kim, and H. Yan,
Adv. Mater., 5, 353 ͑2005͒
25. A. J. Yin, J. Li, W. J. A. J. Benett, and J. M. Xu, Appl. Phys. Lett., 79, 1039 ͑2001͒.
26. G. Hautier, J. D’Haen, K. Maex, and P. M. Vereecken, Electrochem. Solid-State
Lett., 11, K47 ͑2008͒.
27. N. S. Pesika, A. Radisic, K. J. Stebe, and P. C. Searson, Nano Lett., 6, 1023 ͑2006͒.
28. M. J. Williamson, R. M. Tromp, P. M. Vereecken, R. Hull, and F. M. Ross, Nature
Mater., 2, 532 ͑2003͒.
29. A. Radisic, J. B. Hannon, P. M. Vereecken, P. C. Searson, and F. M. Ross, Nano
Lett., 6, 238 ͑2006͒.
30. F. Iacopi, P. M. Vereecken, M. Schaekers, M. Caymax, N. Moelans, B. Blanpain,
O. Richard, C. Detavernier, and H. Griffiths, Nanotechnology, 18, 505307 ͑2007͒.
31. A. Romo-Negreira, O. Richard, S. De Gendt, K. Maex, M. M. Heyns, and P. M.
Vereecken, Sci. Adv. Mater., 1, 86 ͑2009͒.
32. A. E. Kaloyeros and E. Eisenbraun, Annu. Rev. Mater. Sci., 30, 363 ͑2000͒.
33. A. Romo-Negreira, P. M. Vereecken, C. M. Whelan, G. Groeseneken, and K.
Maex, ECS Trans., 2͑6͒, 409 ͑2007͒.
34. W. Davison and J. A. Harrison, J. Electroanal. Chem. Interfacial Electrochem., 36,
399 ͑1972͒.
Conclusions
35. G. O’Mallory, in Electroless Plating: Fundamentals and Applications, G.
O’Mallory and J. B. Hajdu, Editors, ASCE ͑1990͒.
36. A. Romo-Negreira, D. J. Cott, A. S. Verhulst, S. Esconjauregui, N. Chiodarelli, J.
Ek-Weis, C. M. Whelan, G. Groeseneken, M. M. Heyns, S. De Gendt, et al., Mater.
In summary, we showed that electrodeposition allows the room-
temperature formation of catalyst nanoparticles with a fixed size and
density within specific areas on the wafer. This method provides a
Downloaded on 2014-03-30 to IP 134.208.103.160 address. Redistribution subject to ECS terms of use (see ecsdl.org/site/terms_use) unless CC License in place (see abstract).