8
576
T. Sakamoto et al. / Electrochimica Acta 55 (2010) 8570–8578
3.3. Morphology of Ni deposits
To investigate the reason for the inconsistency of preferred ori-
entation of Ni electrodeposits obtained in the present experiments
from that of Pangarov’s prediction in domain 1, surface and cross-
sectional morphologies of electrodeposits were observed using
SEM and SIM. As shown in SEM images in Fig. 5, surface morphology
changed depending on electrode potential and BD concentration.
In these images, two typical structures can be recognized. One
is spiral-type deposits found in the films deposited at −0.51 V as
indicated by a box in Fig. 5(d). The other is lozenge-type deposits
indicated by diamond frames in Fig. 5(e) (g) and (h), and they were
found on the films deposited at −0.54 to −0.56 V. The size of the
lozenge structures decreased with increases in BD concentration
and current density.
Fig. 6 shows cross-sectional SIM images of samples A-1, B-1
−2
and C-1 electrodeposited at 30 A m . The images on the left are
original SIM images and the images on the right were obtained by
√
multiplying the vertical scale of the left image by 2 to reproduce
Fig. 7. (1 1 0) pole figure for sample A-1 indicating the tilt angle distribution of
{1 1 1} micro-crystals to the surface plane. The symbol + corresponds to {1 1 1} of
standard (1 1 0) projection of a cubic single crystal.
the actual dimension of the cross-section because the observation
angle was 45 to the cross-section. It seems that the incipient Ni
◦
electrodeposits are influenced from substrate, but crystal size grad-
ually departs from the incipient electrodeposits, and finally the Ni
electrodeposits have a crystal size the deposition conditions with-
out substrate influence, as shown in Fig. 6. The substrate material is
not as a critical factor for structure or preferred orientation of elec-
trodeposits except for initial stage. This phenomenon was found
by Finch and Williams [33] who summarized that the effect of sub-
strate on crystal size and orientation gradually disappeared within
◦
◦
two peaks around 0 and 55 marked with +, corresponding to
[1 1 1] of standard [1 1 0] projection of a cubic single crystal. This
result indicates that the film contains micro-crystals of [1 1 1] ori-
◦
entation with tilting angle of ca. 55 to the substrate plane, and the
tilting direction is randomly distributed.
From the above discussion, Ni electrodeposits seem to grow
in a manner predicted from the two-dimensional nuclei theory in
which the growth plane is basically determined by crystallization
overpotential related to supersaturation, but the growth axis is not
always consistent with the preferred orientation axis. Models of
electrodeposition of Ni films on Cu substrates are summarized in
Fig. 8.
3
m from the interface, and the crystal size and orientation could
be characterized by the electrodeposition condition.
In these images, grain size of Ni electrodeposits becomes small
with increase in BD concentration. Sample A-1 is composed of thick
columns inclined to the growth direction and the maximum incline
◦
angle is ca. 58 against the substrate plane. On the other hand,
samples B-1 and C-1 are composed of narrow columns oriented
perpendicularly to the substrate plane. In all samples, grain size is
small at the interface between the film and substrate and increases
with film growth.
Fig. 8(a) shows a model for sample A-1. At the initial stage of
electrodeposition, high density of nucleation causes growth of fine
and dense columns in a direction normal to the substrate plane.
Most of these columns are annihilated in competitive growth, and
only a small number of thick columns survive and grow continu-
ously at the (1 1 1) plane in the growing direction with tilting angle
Sample B-1 shows a spiral structures in the SEM image shown
in Fig. 5(d) and strong (2 0 0) and weak (1 1 1) peaks in XRD spec-
tra shown in Fig. 1(d). A cross-sectional SIM image of sample
B-1 (Fig. 6(d)) indicates that the electrodeposits are composed of
small crystals and large spiral crystals among them. The formation
mechanism of such spiral structures in electrodeposits has been
investigated by many researchers [13–20,32,34–36]. Generally, the
crystal growth process involves surface diffusion of adatoms from
terraces to steps and settlement at kinks [37] (TSK model). If a
screw dislocation exists on the surface of the (1 0 0) plane, the spi-
ral crystal grows in a direction normal to the surface, while the
actual growth plane is (1 1 1) which orientation declines to the sur-
face of the (1 0 0) plane as schematically shown in the top image of
Fig. 8(b).
◦
of ca. 55 to the substrate plane, resulting in apparent orientation
of [1 1 0] observed in XRD measurement.
Fig. 8(b) is a model for sample B-1, in which columnar crys-
tals grow on fine crystals. At the bottom of the film, a considerable
amount of BD adsorbs on the surface, resulting in reduction of grain
size due to an inhibitory effect on crystal growth. This effect is
weakened but continues during the deposition process to keep the
column thin. The top of each column continues to grow in a spi-
ral manner shown in the top drawing in Fig. 8(b), i.e., orientation of
the growing surface, [1 1 1], inclines to the mean growing direction,
[1 0 0].
Fig. 8(c) is a model for sample C-1, and probably B-2 and C-2, in
which the Ni film shows [1 1 1] orientation in XRD results as shown
in Fig. 1, and the film is composed of lozenge-type crystals. The top
drawing in Fig. 8(c) shows growth of lozenge-type crystals in which
fast-growing plane tend to disappear and slow-growing plane tend
to survive [39–41]. Such a manner of growth was observed for a KCl
crystal with a high concentration of Pb impurity [41].
[
1 1 0] orientation in sample A-1 can be explained as follows. The
cross-sectional SIM image in Fig. 6(b) shows that the crystalline col-
◦
◦
umn inclines between 58 and 90 against the surface plane. Since
the apparent incline angle of columns in cross-section changes
depending on the direction of inclination, it is speculated that many
◦
columns incline around 58 . If these columns grew in [1 1 1] orien-
tation, the apparent orientation of this crystal is detected as [1 1 0]
in XRD measurement, because the (1 1 1) plane inclines at 54.8 to
the (1 1 0) plane in an fcc crystal. To confirm this, pole figure ele-
vation profile of sample A-1 was measured to obtain the angular
distribution of crystalline orientation of micro-crystals in a single
sample to the surface plane by the stereographic projection method
Structures and morphology of electrodeposits are affected by
inhibition strength of BD related to its coverage on the surface and
thus to its concentration in the bath. It is reasonable to speculate
that the columnar crystal of sample B-1 was formed by continuous
growth under the condition of weak inhibition, while fine crystals
of sample C-1 were formed by intermittent growth under the condi-
tion of strong inhibition. The coverage of BD depends on orientation
◦
[
38]. The pole profile of sample A-1 shown in Fig. 7 reveals strong