E. Talik et al. / Journal of Alloys and Compounds 616 (2014) 556–568
557
analytical grade. Next, all solutions were combined together and mixed for 6 h at
70 °C using a magnetic stirrer with a stirring speed of 200 rpm resulting in slow
evaporation of the mixture. The volume was decreased by approximately 5 times.
The concentrated solution was subsequently dried at 150 °C for total removal of
water. The dry powder was then calcined in air at 400 °C for 2 h.
the ADPs for the doped LaF3 material resulted in negative values for
fluorine, so in the final model a single isotropic ADP was used for all
sites. Atomic parameters obtained in the refinement are collected
in Tables 1 and 2 and agreement factors in Table 3.
The microstructural observations of the nanopowders as well as the microcom-
positional analysis were conducted using the JEOL-7600F scanning electron
microscope.
The structures are in a good agreement with those published
earlier by Cheetham and Norman [12] for YF3 materials and by
De Rango et al. [15] for LaF3. Additional phases were only observed
in two samples: YF3:1%Pr has a single reflection located at d-spac-
ing 3.02 Å and LaF3:1%Pr exhibits two broad peaks with inter-pla-
nar spacings of d = 3.35 Å and d = 2.91 Å. In the second one, the
d = 3.35 Å impurity was overlapping with the 111 reflection, so
for the final refinement the angular range (25.8–29.0) was
excluded from fit. The single observed impurity line in YF3:1%Pr
Powder diffraction studies were performed on a PW1050 diffractometer in
Bragg–Brentano geometry. A nickel filtered Cu Ka1,2 source was used at 30 kV/
30 mA. The patterns were collected in step mode in the angular range 10–135° with
a step size of 0.02°. The powders were attached to a glass holder using double sided
Scotch tape. One of the samples (1% Ho) had bad adhesion to the tape, which
resulted in appearance of weak sample holder reflections at 14.1°, 17.0° and 25.6°.
The Rietveld method was applied to refine collected patterns using the Fullprof
[5] software. As the width of the diffraction peaks was larger than the machine
broadening, size and strain models appropriate for Laue classes mmm (size = 3,
strain = 18) for YF3 and 6/mmm (size = 12, strain = 19) for LaF3 were added to the
refinement. The anisotropic strain broadening was introduced in the quartic form
[6] with symmetry constraints and adaptation for the Thompson, Cox and
Hastings profile function [7,8]. The anisotropic Lorentzian size broadening was
modeled using the spherical harmonic approach developed earlier for preferred ori-
entation Jarvinen [9]. In all cases the ionic form factors of Y3+, La3+ and Fꢀ were
used in the refinement. Visualization of the structures was done using the VESTA
software [10].
is likely
a 200 reflection of trigonal PrF3 (P-3c1, a = 7.08 Å,
c = 7.24 Å) but there are no other peaks available to corroborate
this finding. Additionally, the finely powdered samples had bad
adhesion to the tape, which resulted in appearance of weak and
broad sample holder reflections at 14.1°, 17.0° and 25.6° (see Sup-
plementary Information).
The machine resolution was estimated from a reference pattern
of silicon. The profile broadening of diffraction peaks due to size
and strain was quantified using general models implemented in
the Fullprof suite. The refinement, which included only the size
broadening was found to be not sufficient for the YF3 series, so
strain broadening was introduced following the formalism pro-
posed by Stephens [7]. Multiple strain parameters SHKL quantifying
strains and fluctuations of metric parameters had to be included:
XPS spectra were obtained using a PHI 5700/660 Physical Electronics Photoelec-
tron Spectrometer with monochromatized Al K X-ray radiation (1486.6 eV). A
a
hemi-spherical mirror analyzer measured the energy of electrons with an energy
resolution of about 0.3 eV. The photoelectron emission from a surface area of
800
lm ꢁ 2000 lm was recorded. All measurements were performed in the condi-
tions of 10ꢀ8 Pa. In every case, a charge neutralizer was used because of the charge
effect which occurs for non-conducting samples. The binding energy was deter-
mined with reference to the C1s component set at 285 eV. Each peak of the
recorded spectrum is characteristic for a certain electron energy level of the mea-
sured elements. However, the measured binding energies are not absolutely con-
stant but depend on the chemical environments, where functional groups are
located due to modification of the valence electron distribution. These differences
in relation to pure elements in the electron binding energies are called chemical
shifts. The angle between the X-ray source and the sample surface was 45°.
For XPS investigations, it is important to determine the relative concentrations
of the various constituents. The Multipak Physical Electronics program enables
quantification of the XPS spectra utilizing peak area and sensitivity factor. The stan-
dard atomic concentration calculation provides a ratio of each component to the
sum of all elements taken into account in the data. Elemental identification, all ele-
ments except H and He are detectable with a detection limit of the order 0.1 at.% for
good quality of the spectra. Only those elements are considered for which the spe-
cific line is clearly visible in the spectrum. For these lines, the background individ-
ually selected in the region limited to the particular line is subtracted and after that
integration of the peak area is performed [11]. The Gaussian–Lorentzian functions
were used to fit the XPS core level spectra.
S400, S040, S004, S220, S202, S022 for the orthorhombic Pnma and S400
,
S004 and S112 for the hexagonal P63cm refinements. The obtained
results are summarized in Tables 4 and 5.
3.1.1. Discussion of strain and size contributions to line profile
The increased surface to bulk ratio in small crystallites, together
with the chemical pressure caused by different ionic radii, may
lead to the appearance of internal stress in the studied materials.
Therefore assessment of the size should be accompanied by the
analysis of the strain. The coherent domain sizes (CDS) obtained
from the Lorentzian component of the width, primarily varying
as 1/cosh, were found to lie between 60 and 85 nm with small
anisotropy of shape of less than 1 nm. During the refinement of
strain – connected primarily with the Gaussian part varying as
tanh – two different behaviors were observed. No strain (within
Magnetic susceptibility was measured using the Quantum Design MPMS-XL-
7AC SQUID magnetometer in the temperature range 2–400 K.
The EPR spectra were collected by the X-band spectrometer with a TE011 rect-
angular cavity and 100 kHz field modulation, equipped with an Oxford Instruments
ESR 910 helium flow cryostat. The microwave frequency was measured using a
Hewlett Packard 534 microwave frequency counter.
3r) was found in the hexagonal, Pr doped LaF3, despite a complete
deviation of the refinement towards Lorentzian contribution,
which had to be fixed at its maximum allowed value of 1. On the
other hand, all samples based on YF3 revealed a non-zero strain
contribution (Table 4), which was mostly confined to the h_l planes
as evidenced by significant values of S400, S004 and S202 parameters
3. Results and discussion
3.1. X-ray diffraction
Table 1
Atomic parameters of the doped YF3 compounds. All uncertainties are statistical on
The starting model for the refinement of the YF3:RE samples
was based on the structure obtained from neutron diffraction by
Cheetham and Norman [12], using the Pnma space group (SG 62),
which was earlier found by Zalkin and Templeton [13].
1r
level.
Parameter
YF3:1%Pr
YF3:1%Ho
YF3:1%Er
YF3:1%Tm
Y position
x
4c (x, 1/4, z) .m.
0.36772(7)
0.05922(11)
0.66(2)
0.36760(8)
0.05904(11)
1.06(2)
0.36768(6)
0.05892(8)
0.41(1)
0.36763(8)
0.05909(10)
0.59(2)
For the LaF3, two different space groups in ambient conditions
have been reported: a centrosymmetric P-3c1 (SG 165) by Mans-
mann [14] or non-centrosymmetric P63cm (SG 185) by De Rango
et al. [15]. Both have successfully been applied to a neutron pow-
der diffraction [16] but a later single crystal neutron diffraction
study [17] found the latter to be more appropriate. The chosen
space group P63cm has a floating origin along the c crystallographic
axis and one of the atomic coordinates had to be fixed, so following
Gregson et al. [17], the z coordinate of La was set at z_La = 0.25.
In the case of the YF3 series, atoms were refined with individual
isotropic atomic displacement parameters (ADP). The refinement of
z
Biso (Å2)
F1 position
x
4c (x, 1/4, z)
0.5253(4)
0.5905(6)
0.94(6)
0.5225(4)
0.5914(6)
1.38(6)
0.5231(3)
0.5917(5)
0.70(5)
0.5232(3)
0.5924(6)
0.91(6)
z
Biso (Å2)
F2 position
x
8d (x, y, z)
0.1636(3)
0.0628(2)
0.3766(4)
0.93(5)
0.1646(3)
0.0623(2)
0.3758(4)
1.209(5)
0.1648(3)
0.0626(2)
0.3753(4)
0.61(4)
0.1643(3)
0.0633(2)
0.3756(4)
0.80(5)
y
z
Biso (Å2)