
Journal of Organic Chemistry p. 1846 - 1850 (1989)
Update date:2022-09-26
Topics:
DePuy, Charles H.
Doren, Jane M. Van
Gronert, Scott
Kass, Steven R.
Motell, Edwin L.
et al.
The gas-phase negative-ion chemistry of diazomethane has been investigated by using the flowing afterglow and selected ion flow tube techniques.The gas-phase acidity of diazomethane has been determined to be ΔG(stand., acid)(CH2N2) = 365 +/- 3 kcal/mol <ΔH(stand., acid)(CH2N2) = 373 +/- 3 kcal/mol> and the electron affinity of the diazomethyl radical has been estimated to be 2.0 +/- 0.3 eV.The reactions of the diazomethyl anion with CS2, COS, CO2, and SO2 and with a series of α,β-unsaturated aldehydes and ketones have been studied.Exothermic addition reactionslead to energetic product ions, which fragment by loss of nitrogen.The resulting carbene anions undergo unusual further reactions, either internally or by reaction with the neutral reagents.Michael addition of the diazomethyl anion to the unsaturated aldehydes and ketones can also result in cyclization and loss of an aldehyde to form a pyrazole anion.Diazomethane can also be reduced by hydride transfer to produce an M + 1 ion, which is most likely to the CH2NNH- anion.
View MoreChongqing Changfeng Chemical Co., Ltd.
website:http://www.changfengchem.com
Contact:+86-23-67896333
Address:30th Floor, Longhu Ziduxingzuo Building A, 1st Branch,YuSong Rd., Yubei District, Chongqing, China
Sinopharma Yibin Pharmaceutical Co.,Ltd
Contact:86-831-5109854
Address:Luolong Industry Zone
changsha chenjin chemical technology co.,LtD(expird)
Contact:86-731-84451263
Address:Room 201/217-218, 101 Jingyuan Electronic Technology Co.,Ltd. Testing Center, No.69, Lufeng Road, High-tech Development Zone, Changsha, China
JIN TAN CHENG'EN CHEMICAL CO.,LTD.
Contact:86-519-82116250
Address:NO.102,village Dongfang,conomic development zone
Zhejiang Linhai Xinhua Chemicals Factory
Contact:0086-13661858911
Address:Xunqiao Development Zone, Linhai, Zhejiang, China
Doi:10.1039/a903321a
(1999)Doi:10.1021/acs.joc.9b03041
(2020)Doi:10.1016/S0040-4039(99)00935-1
(1999)Doi:10.1016/S0040-4039(01)91804-0
(1974)Doi:10.1016/0020-1650(69)80050-4
(1969)Doi:10.1016/j.tetlet.2015.12.005
(2016)