Rietveld X-ray powder analysis of InBi crystalline structure at low temperatures

Article abstract of DOI:10.1016/0925-8388(93)90580-G

The dependence of the InBi crystalline structure on temperature (between 300 and 15 K) has been refined by the Rietveld method from X-ray powder diffraction data. The ranges of the lattice parameters (a and c) and the free parameter of the Bi atom (z) in the above temperature range are 5.0101(3)-4.9589(3) angstroms, 4.7824(3)-4.8396(3) angstroms and 0.3993(7)-0.3918(7) respectively.