3
RuSb , a New Metastable Skutterudite Compound
suggestions, the binary compounds have been modified to
make the related filled compounds, A Sb12 (A ) rare
earth; M ) Co, Rh, and Ir), where the A atoms occupy the
2 coordinate “void” site in the skutterudite structure.
The ternary compounds, A Sb12 (A ) rare earth; M )
x
M
4
1
x
M
4
Fe, Ru, Os), have also been extensively studied. In these
compounds, the atom A, in the interstitial site, is necessary
to donate electrons to the compound, stabilizing the struc-
8
ture. The related binary compounds, FeSb
3
, RuSb
, lack filler atoms and are not thermodynamically
stable. Although the binary compound FeSb has been
3
, and
OsSb
3
3
9
formed, it is metastable, and there have been no reports to
date of the synthesis of binary skutterudites formed from
the remaining elements in this column of the periodic table.
The antimony-rich part of the Ru-Sb system has been
previously investigated, but the synthesis of a binary skut-
terudite was not reported.10
Figure 1. Representative low-angle X-ray diffraction pattern of the
unannealed and annealed (to 335 °C) samples. The Bragg reflection has
disappeared during annealing, indicating complete interdiffusion.
Table 1. Compositional Data and Intended and Actual Thicknesses for
All Samples
intended
actual
actual tot.
layer thickness layer thickness thickness
There are extensive similarities among the phases formed
by Sb with the group 8 and 9 transition metals. All six
elements form 1:2 compounds with Sb, and all but Os form
name at. % Ru at. % Sb
(Å)
(Å)
(Å)
A1
A2
A3
A4
A5
A6
A7
A8
4.29
6.77
8.29
16.42
17.68
21.97
35.73
40.61
95.71
93.23
91.71
83.58
82.32
78.03
69.27
59.39
15
16
16
15
15
15
15
15
14.5
15.6
15.9
11.9
14.4
12.1
14.5
15.8
474
795
684
1045
no peaks
1051
1
:1 compounds. All the 1:2 compounds have the marcasite
FeS structure, FeSb, CoSb, and IrSb all have the NiAs
structure, and RuSb and RhSb both have the MnP struc-
2
1
1,12
ture.
These similarities have lead us to attempt to
, both in the hopes that it will prove to be
1145
no peaks
synthesize RuSb
3
useful for thermoelectric applications and to provide further
insight into the factors that control or affect metastable phase
formation.
and on both film and powder samples. The powder samples were
combined with NIST silicon powder standard reference material
number 604b to verify lattice parameters and for quantitative
analysis using Rietveld refinement. Unless indicated otherwise,
samples were annealed for 30 min at a time in a Thermolyne 1500
box furnace under nitrogen atmosphere. Annealing temperatures
ranged from 300 to 600 °C. Compositional studies were conducted
on a Cameca S-50 electron probe microanalysis (EPMA) instrument
using 20 nA beam current and beam voltages of 8, 10, and 15 keV.
Differential scanning calorimetry measurements were conducted
on a Netsch DSC 200 PC. 0.5-1 mg of powder material was used
for all DSC experiments, and the samples were heated from 50 to
550 or 600 °C, at a rate of 2, 5, 10, or 20 °C/min.
Experimental Section
All samples were synthesized in a custom-built ultrahigh vacuum
13
deposition system, described elsewhere. Samples were synthesized
-
6
-7
in a 10 -10 Torr atmosphere. Ruthenium was deposited from
an electron beam gun at a rate of 0.2 or 0.5 Å/s, and antimony was
deposited from an effusion cell at a rate of 1 Å/s. The ruthenium
and antimony layers were deposited alternately for 80 repeats,
resulting in repeat layer thicknesses of 10-15 Å and total sample
thicknesses of 800-1200 Å. A computer-controlled quartz crystal
monitoring system was used to control layer thickness. Samples
were deposited on a 4 in. diameter silicon wafer coated with poly-
Results and Discussion
(
methyl methacrylate) (PMMA), a silicon chip, and a 1 in. square
We synthesized a series of samples that varied in
composition from Sb-rich to Ru-rich, as presented in Table
1. Layer and total thicknesses were calculated from the Bragg
reflections and the Kiessig fringes, respectively. In some
cases the samples were sufficiently rough that no Kiessig
fringes were discernible, and we could not calculate the total
thickness (indicated by “no peaks” in Table 1). These
samples were synthesized with total thicknesses similar to
the other samples. The samples are completely X-ray
amorphous before annealing, indicating that no crystalline
material is present. Figure 1 shows a representative X-ray
reflectivity pattern for a sample before and after annealing
to 335 °C. The Bragg reflection in the unannealed sample
results from the modulation of electron density in the sample
due to sequential deposition of the elements rather than any
crystalline character. The Kiessig fringes are visible in both
scans, but the first Bragg reflection has disappeared during
annealing, indicating that the layers have completely inter-
piece of zero-background cut quartz. The coated wafers were soaked
in acetone to dissolve the polymer, which lifted the powder sample
off of the wafer. The powder sample was collected by vacuum
filtration using a Teflon filter.
X-ray diffraction studies were conducted on the quartz piece and
the silicon chip using a Philips X’Pert diffractometer and a Scintag
XDS-2000 θ-2θ diffractometer. X-ray reflectivity and diffraction
studies were conducted on both as-deposited and annealed samples
(
(
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(10) Caillat, T.; Borshchevsky, A.; Fleurial, J.-P. J. Phase Equilib. 1993,
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(
11) Villars, P.; Calvert, L. D. Pearson’s Handbook of Crystallographic
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Park, OH, 1991.
(
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12) Daams, J. L. C.; Villars, P.; van Vucht, J. H. N. Atlas of Crystal
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Inorganic Chemistry, Vol. 43, No. 8, 2004 2487