V. Prasad / Solid State Communications 145 (2008) 186–191
187
disorder. Such systems show features like weak (electron)
The reduced activation energy is defined as
localization, electron–electron interaction etc. Application of
pressure and magnetic field can tune the position of the mobility
edge with respect to the Fermi energy. This is of particular
interest in carbon compounds such as graphite, pyrocarbons and
conducting polymers.
We have earlier [10] reported the metal–insulator transition
in the amorphous carbon films prepared from succinic
anhydride by the pyrolysis method. This paper deals with the
magnetoresistance properties of the amorphous carbon films
which are in the non-metallic regime (critical or insulating) of
the M–I transition.
d ln ρ(T )
W(T ) = −
.
(1)
d ln T
The low temperature behavior of W can be used to identify
the various transport regimes. In the insulating regime of the
metal–insulator transition, W has a negative temperature coef-
ficient and the resistivity has strong temperature dependence. In
the critical regime, the parameter W is temperature independent
at low temperatures. In the metallic regime (W → 0 as T → 0)
of the M–I transition the sign of dW/dT is positive.
In the insulating regime, the films showed an activated
behavior and the temperature dependence of conductivity
followed variable range hopping conduction. The charge
carriers at the Fermi surface are strongly localized in the
insulating regime. The resistivity in the strongly localized
regime is given by the equation
2. Experimental — Details
The amorphous carbon films are prepared by the high
temperature pyrolysis method. The carbon rich precursor
succinic anhydride is pyrolyzed at different temperatures
ranging from 700–980 ◦C in a one end closed fused silica
tube. The carbon films are deposited on smoothened quartz
substrate and showed amorphous nature as revealed from
X-ray diffraction. The scanning electron microscopy on the
film surface revealed the spherical globule formation that
led to cluster formation at higher pyrolysis temperatures.
The electrical contacts are made with conducting silver paste
and a standard four-probe technique is used for conductivity
measurements. The low temperature magnetotransport studies
are performed using a liquid helium superconducting magnet
cryostat down to 1.3 K and magnetic fields up to 7 T.
ꢀꢁ ꢂ ꢃ
p
T0
ρ(T ) = ρ0 exp
.
(2)
T
1
d+1
For d-dimensional Mott VRH, p =
.
By plotting the logarithm of resistivity against the powers of
the reciprocal temperature (1/T ), the p value can be extracted.
p = 1/4 in 3D and in 2D, p = 1/3.
In the Coulomb-gap (CG) Efros–Shklovskii VRH regime the
temperature dependence of conductivity changes from 1/4
ꢀ
ꢃ
ꢄ
ꢅ
0.5
T0
T
to 1/2 and is given by σ = σ0 exp −
. This is
3. Results
due to the fact that the Fermi level lies in the region of
localized states. The low temperature dc conduction is due
to hopping of charge carriers between such localized states
inside an energy band that is localized near the Fermi level.
The width of the band decreases when the temperature is
◦
The amorphous carbon films prepared at 700 and 750 C
are more disordered and are on the insulating side of the
metal–insulator transition. The films prepared at 800 and
◦
850 C are in the critical regime of the M–I transition. Above
◦
lowered. The a-C films prepared at 700 and 750 C (Fig. 1),
that temperature the films are less disordered and are on the
metallic side of the M–I transition. The room temperature
conductivity of the films varies from 1–120 S/cm depending
on the pyrolysis temperature.
showed insulating behavior at◦low temperatures whereas the
films prepared at 800 and 850 C (Fig. 2) are semiconducting
with a weak temperature dependence of resistivity. In the films
prepared at low temperature (700 ◦C), there is a variation
of six orders of change in the resistivity. On the other hand
the variation is only 1.85 times at the lowest temperature
3.1. Zero field conductivity
◦
(1.3 K) in the films prepared at 850 C. The films that are
Materials are classified as metals, semiconductors and
insulators in terms of their resistivity and its temperature
dependence. The temperature coefficient of resistance (TCR)
concept is valid generally for crystalline systems in which the
wave functions of the charge carriers extend over the entire
crystal. This picture breaks down in a disorder system. The
temperature coefficient of resistance (TCR) is not a proper
parameter and can be positive or negative for a number of
amorphous metallic systems (Mooji correction).
The most authentic way of identifying the various regimes
(metallic, critical and insulating) in the disordered systems is
through Zabroskii plots of the logarithmic derivative of the
conductivity [13]. This plot facilitates the identification of the
various regimes of the electrical transport.
in the critical regime showed power law behavior and the
conductivity is given by [σ(T ) ∝ T β]. The films prepared
at higher pyrolysis temperatures show less disorder and are
in the metallic regime of the metal–insulator transition. Fig. 3
shows the normalized resistivity versus temperature curve on
the logarithmic scale. From these graphs it is evident that as
the preparation temperature is increased the extent of disorder
decreases for these films.
In non-crystalline systems, the resistivity ratio is another
parameter to quantify the disorder in various regimes. The
smaller the resistivity ratio the less is the disorder in the
system. The disorder in different samples is quantified from the
h
i
ρ
4.2K
resistivity and ratio
to sort out the various regimes in the
ρ
300K