D. Gupta et al. / Journal of Physics and Chemistry of Solids 66 (2005) 861–868
867
in the surface roughness. The average surface roughness of
the electrodeposited Cu and Co layers were found to be 1.3
and 1.1 nm. The surface roughness did not change
significantly even after deposition of 40 bilayers of the
Cu/Co(Cu).
Glancing angle X-ray diffraction studies of the as grown
Cu/Co(Cu) multilayers revealed sharp reflexes flanked by
satellites. Formation of coherent multilayers using electro-
deposition technique can thus be concluded.
Acknowledgements
This work was carried out from the research grants
received from the Department of Science and
Technology Govt. of India, New Delhi and the Special
Assistance/COSIST program grant of UGC, New Delhi.
These are gratefully acknowledged.
Fig. 8. Glancing angle X-ray diffraction data recorded for Cu/Co(Cu)
multilayer film with 40 bilayer periods. The pulse height employed for
copper and Cobalt deposition programmes were K0.35 and K1.1 V (vs
SCE).
corresponds to main diffraction peak for (200) planes of the
copper substrate. The zeroth order main diffraction peak of
the Cu /Co(Cu) multilayer can be seen at 50.98 near (200)
peak of Cu. This multilayer peak can be seen to be flanked
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