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a second-order process proportional to the square of the triplet-
exciton concentration; we expected that the triplet excitons
generated by the device are nearly proportional to the current
density of the device. Similarly, the dependence of luminescence
on current density as shown in Fig. S15 (ESI†) is a non-linear
curve. The luminescence increased more than linearly with an
increase in current density, a characteristic of TTA-type devices.12
The other evidence to support TTA is that the decay rate of the
transient EL intensity is second-order with respect to the transient
EL intensity (Fig. S12 and S13, ESI†).
In summary, we have demonstrated that DMPPP/TS-based
devices are highly efficient affording the highest EQE of 10.2%
and a maximum current efficiency of 12.3 cd Aꢀ1. Both DMPPP
and TS appear to exhibit TTA-type delayed EL. This is the first
time that pyrene- and triphenylene-containing materials with
TTA properties were used in OLEDs. In contrast to the TADF-
based OLEDs, which generally have low maximum luminance
and high roll-off efficiencies, the present devices A–D provide
very high luminance in the range of 33 510–68 670 cd mꢀ2
without compromising on the efficiency.
We thank the Ministry of Science and Technology of the
Republic of China (NSC-102-2633-M-007-002) for financial support
of this research and the National Center for High-Performance
Computing (Account number: u32chc04) of Taiwan for providing
the computing time.
Notes and references
1 Q. Zhang, J. Li, K. Shizu, S. Huang, S. Hirata, H. Miyazaki and
Fig. 3 (a) Transient EL of devices A–F measured at 450 nm; (b) transient
EL of the devices doped with different concentrations of TSTA (the device
structure is similar to that of device B except for the concentration of
TSTA) measured at 450 nm.
´
C. Adachi, J. Am. Chem. Soc., 2012, 134, 14706; G. Mehes, H. Nomura,
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its concentration influence the relative DF intensity significantly. As
shown in Fig. 3b, the relative DF intensity of the TSTA-doped devices
decreases with increasing TSTA concentrations suggesting that a
low TSTA concentration in the DMPPP host gives a relatively high
DF intensity. Device B with an optimized TSTA/DMPPP ratio of 95/5
in the emitting layer contains a substantial DF contribution of the
EL intensity. To further understand the DF properties of these EL
devices, we tried to fit the transient EL curves in Fig. 3. A plot of the
inverse of relative transient EL intensity vs. time (between 5 and
15 ms) is linear for each transient EL curve (see Fig. S12 and S13
(ESI†) for the slopes). The results show that the transient EL decay is
second-order to the EL intensity and supports that the DF of these
devices is due to a TTA process (T1 + T1 - S1 + S0) which is known
to be second-order with respect to the T1 concentration.4,10
The delayed EL spectrum of TSTA-doped device B is slightly red
shifted compared with its device and prompt EL spectra (Fig. S9,
ESI†). Moreover, the delayed EL spectrum of the non-doped device E
exhibits a much broader emission with a shoulder at 550 nm, which
may be assigned to an excimer emission of DMPPP.11 As a result,
the relatively delayed EL of device E (Fig. S10, ESI†) measured at
550 nm is relatively strong than at 450 nm. The results that support
that the observed DF in the present devices is due to TTA are further
summarized below. One is the EQE vs. luminance curve which
shows an increase in efficiency for higher luminance (see Fig. 2).4
The results agree well with the observed TTA phenomenon which is
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Chem. Commun., 2014, 50, 6869--6871 | 6871