Luminescent Hafnium Thiolate Complexes
Organometallics, Vol. 17, No. 25, 1998 5449
(ꢀmax/dm3 mol-1 cm-1): 318 (4300), 368 (2300). Positive ion
EI-MS: m/z ) 628 {M}+, 571 {M - C4H9}+, 538{M - SC4H9}+,
481 {M - SC4H9 - C4H9}+. Anal. Found: C, 53.41; H, 7.67.
Calcd for C28H48S2Hf: C, 53.56; H, 7.65.
structure was solved by direct methods (SIR92)5a and ex-
panded by the Fourier method; refinement was by full-matrix
least squares using the software package TeXsan5b on a Silicon
Graphics Indy computer. A crystallographic asymmetric unit
consists of half of one molecule with the Hf atom at special
position. All 16 non-H atoms of the asymmetric unit were
refined anisotropically, and the 24 H atoms at calculated
positions with thermal parameters equal to 1.3 times that of
the attached C atoms were not refined. Convergence for 141
variable parameters by least-squares refinement on F with w
) 4Fo2/σ2(Fo2), where σ2(Fo2) ) [σ2(I) + (0.020 Fo2)2] for 2167
reflections with I > 3σ(I) was reached at R ) 0.019 and wR )
0.025 with a goodness-of-fit of 1.58. (∆/σ)max ) 0.01. The final
difference Fourier map was featureless, with maximum posi-
tive and negative peaks of 0.51 and 0.55 e Å-3, respectively.
(η5-C5Me5)2Hf(SC6H5)2 (2). The procedure was similar to
that of 1 except HSC6H5 (0.066 g, 0.60 mmol) was used in place
of HSnBu to give 2 as yellow crystals. Yield: 0.12 g (67%). 1H
NMR (300 MHz, C6D6, 298 K, relative to Me4Si): δ 1.93 (s,
30H, C5Me5), 6.89 (t, J ) 8 Hz, 2H, aryl protons para to S),
6.97 (t, J ) 8 Hz, 4H, aryl protons meta to S), 7.86 (d, J ) 8
Hz, 4H, aryl protons ortho to S). UV-vis in toluene (298 K),
λ
max/nm (ꢀmax/dm3 mol-1 cm-1): 332 (11000), 392 (7600).
Positive ion EI-MS: m/z ) 668 {M}+, 559 {M - SC6H5}+, 533
{M - Cp*}+. Anal. Found: C, 57.56; H, 5.92. Calcd for
C
32H40S2Hf: C, 57.58; H, 5.99.
Cr ysta l Da ta for 2: C32H40S2Hf, Mr ) 667.28, monoclinic,
space group C2/c (No. 15), a ) 14.414(5) Å, b ) 11.466(3) Å, c
) 18.190(3) Å, â ) 103.18(2)°, V ) 2927(1) Å3, Z ) 4, Dc )
1.732 g cm-3, µ(Mo KR) ) 37.18 cm-1, F(000) ) 1344, T ) 301
K. A yellow crystal of dimensions 0.25 × 0.20 × 0.35 mm
mounted on a glass fiber was used for data collection at 28 °C
on an Enraf-Nonius CAD4 diffractometer with graphite-
monochromated Mo KR radiation (λ ) 0.710 73 Å) using ω-2θ
scans with ω-scan angle (0.66 + 0.35 tan θ)° at a scan speed
of 1.18-5.49 deg min-1. Intensity data (in the range of 2θmax
) 50°; h, 0 to 17; k, 0 to 13; l, -21 to 21 and 3 standard
reflections measured after every 300 reflections showed no
decay) were corrected for Lorentz and polarization effects and
empirical absorption corrections based on the ψ-scan of four
strong reflections (minimum and maximum transmission
factors 0.833 and 1.000). A total of 2831 reflections were
measured, of which 2732 were unique and Rint ) 0.011; 2484
reflections with I > 3σ(I) were considered observed and used
in the structural analysis. The space group was determined
on the basis of systematic absences and a statistical analysis
of intensity distribution, and the successful refinement of the
structure was solved by direct methods (SIR92)5a and ex-
panded by the Fourier method; refinement was by full-matrix
least squares using the software package TeXsan5b on a Silicon
Graphics Indy computer. A crystallographic asymmetric unit
consists of half of one molecule with the Hf atom at special
position. All 18 non-H atoms of the asymmetric unit were
refined anisotropically, and the 20 H atoms at calculated
positions with thermal parameters equal to 1.3 times that of
the attached C atoms were not refined. Convergence for 159
variable parameters by least-squares refinement on F with w
) 4Fo2/σ2(Fo2), where σ2(Fo2) ) [σ2(I) + (0.028Fo2)2] for 2484
reflections with I > 3σ(I) was reached at R ) 0.024 and wR )
0.038 with a goodness-of-fit of 2.17. (∆/σ)max ) 0.02. The final
difference Fourier map was featureless, with maximum posi-
tive and negative peaks of 0.61 and 1.18 e Å-3, respectively.
(η5-C5Me5)2Hf(SC6H4OMe-p)2 (3). The procedure was
similar to that of 1 except HSC6H4OMe-p (0.084 g, 0.60 mmol)
was used in place of HSnBu to give 3 as pale yellow green
crystals. Yield: 0.13 g (66%). 1H NMR (300 MHz, C6D6, 298
K, relative to Me4Si): δ 1.97 (s, 30H, C5Me5), 3.25 (s, 6H, OMe),
6.63 (d, J ) 8 Hz, 4H, aryl protons meta to S), 7.77 (d, J ) 8
Hz, 4H, aryl protons ortho to S). UV-vis in toluene (298 K),
λ
max/nm (ꢀmax/dm3 mol-1 cm-1): 330 (8800), 396 (5600). Positive
ion EI-MS: m/z ) 728 {M}+, 589 {M - SC6H4OMe-p}+. Anal.
Found: C, 56.28; H, 6.07. Calcd for C34H44O2S2Hf: C, 56.16;
H, 6.06.
(η5-C5Me5)2Hf(SC6H4tBu -p)2 (4). The procedure was simi-
t
lar to that of 1 except HSC6H4 Bu-p (0.10 g, 0.60 mmol) was
used in place of HSnBu to give 4 as pale yellow crystals.
Yield: 0.15 g (71%). 1H NMR (300 MHz, C6D6, 298 K, relative
t
to Me4Si): δ 1.14 (s, 18H, Bu), 1.99 (s, 30H, C5Me5), 7.03 (d,
J ) 8 Hz, 4H, aryl protons meta to S), 7.84 (d, J ) 8 Hz, 4H,
aryl protons ortho to S). UV-vis in toluene (298 K), λmax/nm
(ꢀmax/dm3 mol-1 cm-1): 332 (9700), 394 (6200). Positive ion
EI-MS: m/z ) 780 {M}+, 615 {M - SC6H4 Bu-p}+. Anal.
t
Found: C, 61.77; H, 7.29. Calcd for C40H56S2Hf: C, 61.66; H,
7.19.
P h ysica l Mea su r em en ts a n d In str u m en ta tion . UV-
visible spectra were obtained on a Hewlett-Packard 8452A
diode array spectrophotometer and steady-state excitation and
emission spectra on a Spex Fluorolog 111 spectrofluorometer
equipped with a Hamamatsu R-928 photomultiplier tube
detector. Low-temperature (77 K) spectra were recorded by
using an optical Dewar sample holder. 1H NMR spectra were
recorded on a Bruker DPX300 Fourier transform NMR spec-
trometer. Chemical shifts were reported relative to tetra-
methylsilane. Positive ion EI mass spectra were recorded on
a Finnigan MAT95 mass spectrometer.
Cr ysta l Str u ctu r e Deter m in a tion . Cr ysta l Da ta for 1:
28H48S2Hf, Mr ) 627.30, monoclinic, space group C2/c (No.
C
15), a ) 14.843(3) Å, b ) 13.233(2) Å, c ) 16.332(5) Å, â )
116.07(2)°, V ) 2881(1) Å3, Z ) 4, Dc ) 1.446 g cm-3, µ(Mo
KR) ) 37.72 cm-1, F(000) ) 1280, T ) 301 K. A pale yellow
crystal of dimensions 0.15 × 0.15 × 0.30 mm mounted on a
glass fiber was used for data collection at 28 °C on an Enraf-
Nonius CAD4 diffractometer with graphite-monochromated
Mo KR radiation (λ ) 0.710 73 Å) using ω-2θ scans with
ω-scan angle (0.80 + 0.35 tan θ)° at a scan speed of 1.50-8.24
deg min-1. Intensity data (in the range of 2θmax ) 48°; h, 0 to
17; k, 0 to 15; l, -18 to 18 and 3 standard reflections measured
after every 300 reflections showed decay of 4.75%) were
corrected for decay and for Lorentz and polarization effects
and empirical absorption corrections based on the ψ-scan of
four strong reflections (minimum and maximum transmission
factors 0.836 and 1.000). A total of 2479 reflections were
measured, of which 2416 were unique and Rint ) 0.010; 2167
reflections with I > 3σ(I) were considered observed and used
in the structural analysis. The space group was determined
on the basis of systematic absences and a statistical analysis
of intensity distribution, and the successful refinement of the
Cr ysta l Da ta for 3: C32H44O2S2Hf, Mr ) 727.33, monoclinic,
space group C2/c (No. 15), a ) 18.034(3) Å, b ) 11.105(2) Å, c
) 16.835(3) Å, â ) 109.69(2)°, V ) 3174(1) Å3, Z ) 4, Dc )
1.522 g cm-3, µ(Mo KR) ) 34.40 cm-1, F(000) ) 1472, T ) 301
K. A yellow green crystal of dimensions 0.25 × 0.15 × 0.30
mm on a glass fiber was used for data collection at 28 °C on
an MAR diffractometer with a 300 mm image plate detector
using graphite-monochromated Mo KR radiation (λ ) 0.710 73
Å). Data collection was made with 3° oscillation (60 images)
at 120 mm distance and 280 s exposure. The images were
interpreted and intensities integrated using the program
DENZO.5c A total of 3073 unique reflections were obtained
(5) (a) SIR 92: Altomare, A.; Cascarano, M.; Giacovazzo, C.; Gua-
gliardi, A.; Burla, M. C.; Polidori, G.; Camalli, M. J . Appl. Crystallogr.
1994, 27, 435. (b) TeXsan: Crystal Structure Analysis Package;
Molecular Structure Corporation: The Woodlands, TX, 1985 & 1992.
(c) DENZO: In The HKL ManualsA description of programs DENZO,
XDISPLAYF, and SCALEPACK; written by Gewirth, D. with the
cooperation of the program authors Otwinowski, Z., and Minor, W.;
Yale University: New Haven, CT, 1995.