NOTES
slightly and so did the adhesion force. After the humidity
was raised to above 60%, ions dissolved in the film made
the surface free energy increase much and hence the adhe-
sion force increased dramatically.
4. Werts, M. P. L., van der Vegte, E. W., Hadziioannou, G., Surface
chemical reactions probed with scanning force microscopy,
Langmuir, 1997, 13: 4939.
5. Noy, A., Frisbie, C. D., Rozsnyai, L. F. et al., Chemical force mi-
croscopy: exploiting chemically-modified tips to quantify adhe-
sion, friction, and functional group distribution in molecular as-
sembly, J. Am. Chem. Soc., 1995, 117: 7943.
6. Stuart, K., Hlady, V., Effects of discrete protein-surface interac-
tions in scanning force microscopy: adhesion force measurement,
Langmuir, 1995, 11: 1368.
The different effects of humidity on the adhesion
force on CaF and KCl showed again that in AFM, when
2
the liquid film is continuous, the adhesion force between
the tip and sample is mainly dependent on the surface free
energy of the film, but almost independent of the thick-
ness of the film.
7. Chen, X., Davies, M. C., Roberts, C. J. et al., Recognition of pro-
tein adsorption onto polymer surfaces by scanning force micros-
copy and probe surface adhesion measurements with protein-
coated probes, Langmuir, 1997, 13: 4106.
8. Derjaguin, B. V., Churaev, N. V., Structure of water in thin layers,
Langmuir, 1987, 3: 607.
9. Hu, J., Xiao, X. D., Ogletree, D. F. et al., Imaging the condensa-
tion and evaporation of molecularly thin films of water with
nanometer resolution, Science, 1995, 268: 267.
10. Dai. Q., Hu, J., Salmeron, M., Adsorption of water on NaCl(100)
surfaces: Role of atomic steps, J. Phys. Chem. B, 1997, 101: 1994.
11. Beaglehole, D., Christenson, H. K., Vapor adsorption on mica and
silicon: Entropy effects, layering, and surfaces forces, J. Phys.
Chem., 1992, 96: 3395.
12. Weisenhorn, A. L., Hansma, P. K., Forces in atomic force micros-
copy in air and water, Appl. Phys. Lett., 1989, 54: 2651.
13. Thundat, T., Zheng, X. Y., Chen, G. Y. et al., Role of relative hu-
midity in atomic force microscopy imaging, Surface Science,
1993, 294: L939.
14. Eastman, T., Zhu, D. M., Adhesion forces between sur-
face-modified AFM tips and a mica surface, Langmuir, 1996, 12:
2859.
The magnitude of the measured adhesion force may
differ from one tip to another. This may be caused by two
factors. (ν) Different tips have different radii; and from
the equation Fcap = 4SꢁRJꢁcosTꢁ>ꢂꢃ@ (Fcap, capillary force; R,
radius of contact area; J, surface tension or surface free
energy of the liquid; Tꢁ, contact angle of the liquid-solid
interface), we can know that this will make the capillary
force between the tip and sample different and thus pro-
duces different adhesion forces. (ξ) Different properties
of tips such as contaminants adsorbed on the tip and the
real value of the elastic constant can also result in differ-
ent adhesion forces. Therefore, definite calibration of the
properties of the tip is very important to the quantification
of the force spectrum method.
3
Conclusion
In summary, by the force spectrum method, the sur-
face adhesion force of mica, CaF2 and KCl were measured
as the relative humidity changed. It is concluded that
when the adsorbed liquid film is continuous, the adhesion
force between the tip and sample is mainly dependent on
the surface free energy of the adsorbed liquid but almost
unaffected by its thickness.
15. Soviet Union Chemistry Handbook (ĉ) (Chinese edition by Tao
Kun), Beijing: Science Press, 1963.
16. Soviet Union Chemistry Handbook (ċ)(Chinese edition by Tao
Kun), Beijing: Science Press, 1963.
17. Peters, S. J., Ewing, G. E., Thin film water on NaCl(100) under
ambient conditions: an infrared study, Langmuir, 1996, 12: 6345.
18. Fu, X.-C. Shen, W.-X., Yao, T.-Y., Physical Chemistry(Ċ)(in
Chinese), Beijing: Higher Education Press, 1993.
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(Received September 1, 2000)
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Chinese Science Bulletin Vol. 46 No. 11 June 2001