ISSN 0036-0244, Russian Journal of Physical Chemistry A, 2008, Vol. 82, No. 5, pp. 830–834. © Pleiades Publishing, Ltd., 2008.
Original Russian Text © I.A. Kirovskaya, E.V. Mironova, E.I. Bykova, O.T. Timoshenko, T.N. Filatova, 2008, published in Zhurnal Fizicheskoi Khimii, 2008, Vol. 82, No. 5,
pp. 949–953.
PHYSICAL CHEMISTRY
OF SURFACE PHENOMENA
Adsorption and Electrophysical Studies of the Sensitivity
and Selectivity of the Surface of the InSb–CdTe System
with Respect to Toxic Gases
I. A. Kirovskaya, E. V. Mironova, E. I. Bykova, O. T. Timoshenko, and T. N. Filatova
Omsk State Technical University, Omsk, Russia
e-mail: phiscem@omgtu.ru
Received May 2, 2007
Abstract—The piezoquartz microweighing and probe compensation methods were used to study the adsorp-
tion properties with respect to NO and changes in the electrical conductivity of solid solutions and the binary
2
components of the InSb–CdTe system under the influence of NO and NO + SO and NO + CO mixtures at
2
2
2
2
various temperatures and relative gas contents. Solid solutions were prepared by isothermal diffusion and cer-
tified using the results of X-ray, thermographic, IR spectroscopic, and electrophysical measurements. The
(
InSb)0.03(CdTe)0.97 component of the system was found to possess high selective sensitivity (adsorption and
electronic) already at room temperature. This component was recommended for creating a sensor for NO2
microimpurities.
DOI: 10.1134/S0036024408050233
INTRODUCTION
physicochemical properties of this material and sub-
strate [2]. Solid solution powders were obtained by iso-
thermal diffusion of the binary components in evacu-
ated sealed quartz ampules at temperatures above the
melting point of the low-melting component (InSb) [3].
The composition of solid solutions obtained depended
on the mutual solubility of the binary components (up
to 6 mol % InSb in CdTe and up to 5 mol % CdTe in
InSb).
The most important problem of the chemistry of
semiconductors is the preparation of new systems on
the basis of known binary compounds. These systems
should retain the properties of the initial binary com-
pounds and exhibit new, possibly predictable, charac-
teristics. Such systems are semiconducting solid solu-
tions, whose typical representatives are solid solutions
based on InSb and CdTe considered in this work. The
unique properties of InSb and CdTe (electric, photo-
and piezoelectric, and optical) and their capabilities
already used in several technologies and semiconduct-
The thickness of films was determined by interfer-
ometry, from changes in piezoquartz resonator fre-
quency [4], and using the equation
ing catalysis allow us to regard (InSb) (CdTe)
solid
2
x
1 – x
D = msinβ/(4πl ρ),
solutions as promising adsorbents, catalysts, and mate-
rials for modern technology, sensor electronics in the
first place. The effectiveness of use in any of these areas
depends on the degree to which the physicochemical
state of the surface (including chemical composition,
structure, and acid–base, adsorption, and electronic
where m is the sample weight, ρ is the sample density,
l is the distance from the vaporizer to the substrate, and
β is the vaporization angle. The D value was 0.25–
0
.35 µm.
The structure of films was studied by X-ray diffrac-
properties and their selective changes under the action tion. X-ray diffraction along with thermographic anal-
of various media) has been studied. The present work is ysis and forbidden band width and electrical conductiv-
concerned with exactly this aspect of studies of the sur- ity measurements was also used to certify the solid
face of InSb–CdTe system components.
solutions obtained [5].
The adsorbates were prepared following standard
procedures [2, 6]; that is, carbon(II) oxide, by the
decomposition of formic acid in the presence of con-
centrated sulfuric acid; nitrogen(IV) oxide, by the
action of concentrated nitric acid on copper shavings;
and sulfur(IV) oxide, by the action of concentrated sul-
furic acid on sodium sulfite.
EXPERIMENTAL
The samples studied, InSb, CdTe, and solid solution
films, were prepared by discrete thermal deposition in a
vacuum (Tcond = 298 K, p = 1.33 × 10 Pa) onto elec-
trode surfaces of piezoquartz resonators followed by
annealing in vapor of the initial material [1]. The con-
–
3
Adsorption was studied by piezoquartz micro-
–
11
2
ditions of annealing were determined on the basis of the weighing (sensitivity 1.23 × 10 g/(cm Hz)) over the
8
30