crystallographic structure of the deposited InN was examined
by a Rigaku Rint 2000 X-ray diffractometer. Their crystallinity
was evaluated by scanning electron microscopy (SEM), trans-
mission electron microscopy (TEM) and electron diffraction.
The crystal structure and orientation of the as-grown films
were examined by means of the X-ray diffractometry (XRD).
Only the diffraction peaks of InN and the Si substrate were
observed. The observed diffraction lines reveal that the
hexagonal structure is the only crystalline phase, exhibiting
sharp and symmetric reflections for basal (002) and (004)
planes, and broad and asymmetric reflections for the non-basal
(101), (103) and (110) planes.5 The lattice constant was
estimated to be 0.570 nm utilising the observed (002)
diffraction, which implies that the obtained lattice constant is
similar to the reported value of 0.57033 nm for the polycrystal-
line InN powder.5
Fig. 1(a) and (b) show SEM micrographs of the InN grown on
the Si(100) substrate under the conditions listed in Table 1. At
a glance of the SEM micrographs in Fig. 1(a), it is immediately
noticed that the deposited InN has an interesting geometry with
flower-like structure. The enlarged SEM micrograph of a
flower-like InN arrangement shows that it consists of six petal
crystals and a style crystal (Fig. 1(b)). One can see that there is
a sixfold axis along the style, and that the respective crystals
constituting the petals and a style are staggered hexagonal
bipyramids. The flower-like InN was formed only when the
substrate temperature was kept at 823 K. As for the partial
pressure of NH3, it was found that the geometry with flower-like
structure was hardly affected in the range of p(NH3) = 9.3 3
103–2.8 3 104 Pa at a constant partial pressure of InCl3 of 4.7
3 102 Pa examined in this study.
A representative TEM micrograph and an electron diffraction
pattern of the indium nitride crystals are shown in Fig. 2(a) and
(b), respectively, in which the top of the one of the staggered
hexagonal bipyramidal crystals was measured. In Fig. 2(a), it is
seen that there are a number of lines with a constant spacing of
0.2853 nm, which is assigned to the 002 spacing based on both
the JCPDS data5 and the XRD results mentioned above. Also,
an intense spot pattern appearing in the electron diffraction
image is a characteristic pattern of hexagonal structures (Fig.
2(b)). This means that the staggered hexagonal bipyramidal
crystals are single crystals of InN.
In summary, we have found that InN with flower-like
structure was deposited onto an Si(100) substrate by AP-HCVD
upon reaction of InCl3 and NH3. Each crystal constituting the
flower is a single crystal with staggered hexagonal bipyramidal
structure. The formation of such highly unusual crystals is
sensitive to the substrate temperature.
This work was supported by the Japan Society for the
Promotion of Science through a Grants-in-aid for Scientific
Research (A) No. 13305047.
Notes and references
1 P. V. Braun, 223rd ACS National Meeting Orlando, FL, USA, April,
2002, POLY-254(2002); P. H. Holloway and S. L. Jones, J. Surf. Anal.,
1998, 4, 226.
2
M Seto, K. Westra and M. Brett, J. Mater. Chem., 2002, 12, 2348.
3 B. Q. Wei, R. Vajtai, Y. Jung, J. Ward, R. Zhang, G. Ramanath and P. M.
Ajayan, Nature, 2002, 416, 495.
4 N. Takahashi, A. Niwa, T. Takahashi, T. Nakamura, M. Yoshioka and Y.
Momose, J. Mater. Chem., 2002, 12, 1573.
5 JCPDS File 1999, No. 50-1239.
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