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H. Kaneko et al. / Solid State Communications 142 (2007) 32–35
By the correction using the photoionization cross sections of
O 1s and Ti 2p levels [13], the compositions of the Ti oxides
can be estimated from the ratio of the O 1s and Ti 2p peak
intensities (IO1s/ITi2p). The results show that the compositions
of the Ti oxide films formed in O2 at 1.0 × 10−6, 1.0 × 10−8
and 5.0×10−9 Torr are TiO2.1, TiO1.1 and TiO0.73, respectively,
also suggesting that TiO2-like film is formed in O2 at 1.0×10−6
Torr while the TiO-like film is formed in O2 at 1.0 × 10−8 and
In Fig. 1, the Ti 2p spectra of the Ti oxide films after heating
at 600 ◦C are also shown as solid lines. Fig. 1 shows that
the spectral intensities are decreased while the peak energies
are nearly unchanged upon heating at 600 ◦C for all measured
films, indicating that the oxidation state of Ti in the oxide
films is nearly unchanged by heating at 5600 ◦C. The surface
covered with the Ti oxide films formed at room temperature
gives diffuse LEED patterns with broadened (1 × 1) spots
independent of the O2 pressure during Ti deposition, and
therefore the TiO2-like film and TiO-like film formed at room
temperature are thought to have structures with disorder over
a long-range scale. However, when the surface covered with
the TiO2-like film is heated at 600 ◦C, the disordered pattern
changes into a (5 × 1) pattern. The LEED pattern of the surface
covered with the TiO2-like layer formed by Ti deposition in O2
at 1 × 10−6 Torr and subsequently heated at 600 ◦C is shown
in Fig. 2(b). The surface gives a (5 × 1) pattern, and this film
will be called a (5 × 1) TiO2 film hereafter. On the other hand,
when the surface covered with the TiO-like film is heated at
600 ◦C, the disordered pattern changes into a sharp (1 × 1)
pattern. Fig. 2(c) shows the pattern of the surface on which Ti
is deposited in O2 at 1.0 × 10−8 Torr and subsequently heated
at 600 ◦C. The surface gives a clear (1 × 1) pattern, indicating
that the periodicity of the Ti oxide film after heating at 600 ◦C
is the same as that of the Ag(100) surface. This film will be
called a (1 × 1) TiO film hereafter. The thickness (d) of the
ordered Ti oxide film is estimated from the measurements of
Fig. 3. He I UPS spectra of (a) the Ag(100) clean surface, (b) the surface after
−6
◦
Ti deposition in O at 1.0×10 Torr and subsequent heating at 600 C and (c)
2
−8
the surface after Ti deposition in O at 1.0 × 10 Torr and subsequent heating
2
◦
at 600 C.
film has a distorted rutile TiO2 structure whose lattice constants
5
˚
˚
are a = rAg = 4.82 A and c = rAg = 2.89 A with the a and
3
¯
c axes parallel to the [110] and [110] directions of Ag(100),
respectively. In this case, the (5×1) LEED pattern (Fig. 2(b)) is
interpreted as originating from the two types of (5×1) domains
which are rotationally misaligned by 90◦.
TiO2 is a typical semiconductor with a band gap of
∼3 eV [11], while TiO is expected to have metallic conductivity
due to the existence of a partially filled Ti 3d band around
the Fermi level (EF) [2,5,6]. Therefore, the electronic states
of the Ti oxide films, especially in the vicinity of EF, are of
interest. Fig. 3 shows UPS spectra of the Ag(100) clean surface
and of the surfaces covered with Ti oxide films. For the clean
surface (Fig. 3(a)), the Ag 4d band is observed at 4–7 eV
and the spectrum is typical of the UPS spectra of Ag. As the
Ag(100) surface is covered by the (5 × 1) TiO2 film, the Ag
4d band emissions are suppressed and a broad band appears
at 4–8 eV (Fig. 3(b)). The band at 4–8 eV has been typically
observed in UPS spectra of TiO2, and has been ascribed to
the O 2p induced valence band [15,16]. Thus the UPS result is
compatible with the model deduced from the XPS results that
the Ti oxide film with (5 × 1) periodicity has a composition
of TiO2. Fig. 3(b) shows that there is no state in the vicinity
of EF in the spectrum of the (5 × 1) TiO2 film, suggesting
that the film corresponds to nearly stoichiometric TiO2 with a
negligible number of O vacancies. On the other hand, as the
surface is covered by the (1 × 1) TiO film, the peaks appear
at just below EF, 2.8 eV, and ∼6 eV (Fig. 3(c)). The O 2p
band of a TiO film was observed at 6.5 eV and 6.4 eV in
the spectra of TiO/MgO(100) [8] and of TiO/TiC(100) [10],
respectively, and thus the band at ∼6 eV is ascribed to the O
2p band of TiO. In contrast to the case of the (5 × 1) TiO2
the attenuation of Ag 3d peaks, using the equation I/I0
=
exp(−d/λ), where I0 and I are the Ag 3d peak intensities in
XPS spectra of the clean surface and of the surface covered
with the oxide film, respectively, and λ is the inelastic mean free
˚
path of Ag 3d photoelectrons (λ is estimated to be 19.3 A in
˚
TiO2 and 17.8 A in TiO [14]). The estimated thicknesses are
12.7 A for the (5 × 1) TiO2 film and 11.5 A for the (1 × 1) TiO
˚
˚
film.
TiO is known to have a NaCl-type crystal structure whose
˚
lattice constant (4.18 A) is slightly larger than that of Ag
˚
(4.09 A). Therefore, it is deduced from the XPS and LEED
results that a slightly compressed TiO(100) single-crystal film
is formed on the Ag(100) surface as the (1 × 1) TiO film when
the surface covered by the TiO-like film is heated at 600 ◦C. It
is more difficult to deduce the structure of the (5×1) TiO2 film.
If TiO2 crystallizes into a rutile structure, the lattice constants
˚
˚
are a = 4.58 A and c = 2.95 A [1], and thus the lattice is not
commensurate with that of Ag(100). However, since the lattice
constants a and c are close to rAg and rAg, respectively, where
5
3
˚
rAg = 2.89 A is the nearest neighbor distance in Ag crystal, one
of the possible models of the (5 × 1) TiO2 structure is that the