ChemCatChem
10.1002/cctc.201800249
FULL PAPER
Giuliana Aquilanti and Luca Olivi, from XAFS beamline at
ELETTRA, and Edmund Welter from P65 at PETRA III, for the
support and expert advice on beamline operation. Thanks also
goes to Mojca Opresnik from the National Institute of Chemistry
TEM /STEM/EDX
Unmodified and Cu-modified TiO
2
-SiO
2
photocatalyst samples for
for N
2
-physisorption measurements.
TEM/STEM/EDX characterization have been prepared by immersing a
Lacey-carbon TEM grid in a water suspension and air-dried at room
temperature. The electron microscopy analysis has been performed by
means of a Field-Emission Transmission Electron Microscope (JEM-
Keywords:
titanium dioxide,
Cu-modified
2 2
TiO -SiO
photocatalysts, photocatalytic activity, Cu K-edge XANES,
EXAFS.
2
100F, JEOL) operated at 200 kV. The microscope is equipped with a
STEM unit and a detector for EDX mapping and spectroscopy (X-MAX80,
Oxford).
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homogenous pellets, pressed from micronized powder mixed with BN. In
all cases the total absorption thickness (µd) of the sample was about 2
above the Cu K-edge. A Si (111) double crystal monochromator was
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, 750 mbar He; (second) 250
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(
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Acknowledgements
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This work was supported by the Ministry of Education, Science
and Sport of Slovenia, the Slovenian Research Agency
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(
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synchrotron radiation facilities of ELETTRA, Trieste, Italy,
beamline XAFS, project 20140041, and P65 beamline of PETRA
III at DESY, Hamburg, Germany, a member of the Helmholtz
Association, project I-20160044 EC, is acknowledged. We thank
[
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