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dispersion of Sn particles between metallic particles which are
inactive to the electrochemical process and useful to improve the
electrical conductivity of the active material [18,19]. The metal
obtain Mx–Sn1−x mixtures with a minimal presence of the inert
phase, M. Recently, we found Mo to have a beneficial effect on
the electrochemical properties of Sn1−xMoxO2 solid solutions in
lithium cells [20,21]; however, these mixed oxides have a draw-
back, an irreversible capacity owing to the irreversible uptake of
lithium to a zero valence sate of the elements. In this work, we
used a different strategy to exploit the favorable effect of Mo and
avoid such a restriction; thus, the element was added during the
formation of Sn via a reductive pathway. The electrochemical
response of the Sn electrode was thus clearly enhanced.
Electrochemical measurements were made in swagelok-type
cells, using lithium as the counter and reference electrode. The
electrolyte was Merck battery electrolyte LP 40 (EC:DEC = 1:1,
w/w, 1 M LiPF6). Electrode pellets were prepared by press-
ing, in a stainless steel grid, ca. 4 mg of active material with
polytetrafluoroethylene (PTFE) (5 wt.%), and acetylene black
(10 wt.%). Galvanostatic tests were conducted under a C/3 gal-
vanostatic regime (C being defined as 1 Li+ ion exchanged in
1 h). Step potential curves were recorded at 2.5 mV/0.22 h per
step. Both types of electrochemical measurements were con-
trolled via a MacPile II potentiostat–galvanostat. Impedance
measurements from 0.01 to 25 kHz (amplitude 3 mV) were made
with a Solartron 1470 battery test unit coupled with a Schlum-
berger SI 1255 frequency response analyzer.
2. Experimental
3. Results and discussion
All chemicals were analytical grade. Sn was prepared by
reducing SnCl4·5H2O aqueous solution with KBH4 in the pres-
ence of Mo powder. A large excess of KBH4 solution, which
was adjusted to pH 12 with 6 M KOH, was employed. The
reaction was carried out under continuous stirring to ensure
homogenization of the emulsion. The product was collected
by centrifugation, washed with distilled water and ethanol, and
dried at 150 ◦C during 1 h under vacuum.
Chemical analyses of the samples were performed by atomic
absorption spectroscopy (AAS) and energy-dispersive X-ray
analysis (EDX). X-ray powder diffraction (XRD) patterns were
recorded in steps of 0.02◦ and 1.2 s on a Siemens D5000
X-ray diffractometer, using Cu K␣ radiation and a graphite
monochromator. Scanning electron microscopy (SEM) images
were obtained on a Jeol JMS-6400 microscope.
X-ray photoelectron spectra were recorded on a Physical
Electronics PHI 5700 spectrometer using non-monochromated
Mg K␣ radiation (hν = 1253.6 eV) and a hemispherical anal-
yser operating at constant pass energy of 29.35 eV. The samples
were prepared as pellets 7 mm in diameter. High resolution
spectra were recorded at 45◦ takeoff angle by a concentric hemi-
spherical energy electron analyser operating in the constant pass
energymodeat29.35 eV, usinga720 m-diameteranalysisarea.
The multiregion spectra were recorded in three different areas
separated by 1 mm. The energy scale of the spectrometer was
calibrated by using the Cu 2p3/2, Ag 3d5/2 and Au 4f7/2 photo-
electron lines at 932.7, 368.3 and 84.0 eV, respectively. Binding
energies were corrected by using that for C 1 s of adventitious
carbon (and the methyl group) fixed at 284.8 eV. Survey spec-
tra over the range 0–1200 eV were recorded at a 187.85 pass
energy, each region being scanned several times to ensure an
adequate signal-to-noise ratio. A 3 × 3 mm sample area was
sputtered with 4 keV Ar+; the sputter rate was assumed to be
∼6 nm min−1 as determined for Ta2O5 under identical sputter-
ing conditions. Spectra were processed by using PHI-Access V.6
and Multipak software, both from Physical Electronics. Surface
atomic concentrations were determined from peak areas, using
Shirley background subtraction and sensitivity factors provided
by the spectrometer manufacturer (Physical Electronics, Eden
Prairie, MN).
Four MoxSn1−x mixtures named A–D of compositions over
the range 0 ≤ x ≤ 0.26 (where x is referred to atomic values) were
Mo structure. No peaks belonging to SnOx and/or MoOx phases
wereobserved. TheunitcelldimensionsandcrystallitesizeofSn
– the latter of which was determined from the Scherrer equation
[22] – are shown in Table 1 together with the mixture composi-
tion as determined by chemical analysis. The presence of Mo had
little effect on the structural parameters of Sn obtained except
for a slight decrease in crystallite size that was less marked for
sample C. The two phases apparent and the absence of changes
in the lattice parameters rule out the formation of Mo–Sn solid
solutions.
Judging from the SEM images (Fig. 2), the presence of Mo
altered the morphology of the tin particles. Thus, sample A con-
sisted of particles of ill-defined shape that were 1–3 m in size.
Mo was present as round particles and the Sn particles tended
to form agglomerates around the Mo particles. Moreover, the
presence of Mo strongly decreased the size of Sn particles to a
few tenths of a micron. A uniform distribution of both types of
metallic particles was inferred from the EDX results.
Fig. 1. XRD patterns for the Sn–Mo samples. Mo reflections are marked with
an asterisk.