222503-3
Pradhan et al.
Appl. Phys. Lett. 86, 222503 ͑2005͒
In view of the above, the origin of the ferromagnetism in
CTO films can be attributed to the presence of Co2+ ions that
are either in the interstitial positions or in the form of a small
metal clusters. This is also consistent with the recent report
of channeling experiments.16 However, the ferromagnetic ex-
change mechanism between Co2+–O–Co3+, giving rise to
ferromagnetism15 in this system seems to be totally implau-
sible in the absence of Co3+ ions. The dispersed Co clusters
or interstitial site occupations show a true diluted magnetic
nature and can be a potentially significance to the field of
spintronics.
In conclusion, we have demonstrated that the epitaxial
Co:TiO2 films grown on sapphire substrates show remark-
able surface morphology comprising of nanocrystalline par-
ticles from a 3D islandlike growth. The studies from x-ray,
magnetic and spectroscopic measurements suggest that the
ferromagnetism observed in Co:TiO2 film is controlled either
by the interstitial Co2+ ions or small clusters. The Co depth
profile clearly indicates the presence of Co clusters at the
interface and on the surface which influence the ferromag-
netism significantly. Our results are significantly important
for fabricating the Co:TiO2 films for possible spintronic ap-
plications.
FIG. 4. ͑Color online͒ Magnetic field dependence of field-cooled ͑FC͒ and
zero-field-cooled ͑ZFC͒ curves of CTO-2 in a field of 200 G. The inset
shows the ferromagnetic hysteresis loops of CTO-2 and CTO-3 films at
300 K.
ture in the rutile structure and may be related to the Co
interstitials or small clusters. The intensity of the broad peak
is much pronounced for CTO-2. Hence, the coincidence of
the presence of this peak and the observed peak due to Co in
x-ray reflection illustrate the presence of either interstitials or
small clusters due to Co. The most probable presence is ei-
ther Co interstitials or very small Co clusters of nm scale,
which is consistent with the recent observation9 of Co nano-
clusters of about 10 nm size in the anatase phase from trans-
mission electron microscopy studies.
FMR is one of the sensitive tools to study the presence
of magnetic ions. In order to infer the Co charge state, we
have studied the FMR spectra of CTO-2 ͑shown in the inset
in Fig. 3͒ at different temperatures, ranging from 100 to 200
K. The temperature independent electron paramagnetic reso-
nance ͑EPR͒ of the EPR cavity is seen at about 3.3 KG. At
100 K, the FMR spectra exhibit pronounced hump at around
2500 G. The hump feature, which is a strong function of
temperature, weakens as temperature is raised. This is a clear
signature of ferromagnetic Co2+ as Co3+ does not show up in
FMR spectra. The decrease of the FMR signal with increas-
ing temperature may be related to the presence of Co3+ ions
at higher temperature. This provides strong experimental evi-
dence in favor of the presence of Co2+ ionic state which is
responsible for the ferromagnetism in CTO films.
Figure 4 shows the field-cooled ͑FC͒ and zero-field-
cooled ͑ZFC͒ magnetization of the CTO-2 film, displaying a
ferromagnetic behavior. The FC and ZFC curves show
anomalous jump at about 100 K, illustrating a sudden change
in the spin structures, which is related to a metastable mag-
netic state. In order to confirm the ferromagnetic behavior,
magnetic field dependence of magnetization ͑MH͒ curves are
shown at 300 K for two representative CTO films, including
CTO-2. The CTO-2 film displays remarkable ferromagnetic
behavior at 300 K. The magnetic field at which the maxi-
mum in magnetization, Hm ͑low field to high field͒ achieved
is estimated to be 2 KG at 300 K. However, the room tem-
perature ferromagnetic hysteresis shrinks significantly for
CTO-3, which can be attributed due to the poor crystalline
quality of these films when synthesized from the target con-
taining higher concentration of Co as discussed earlier. It is
noted that the background magnetic contribution due to sap-
phire substrate has not been corrected. This will further in-
crease the Hm values. However, this may not affect the quali-
This work is supported by the NASA and NSF for Cen-
ter for Research Excellence in Science and Technology
͑CREST͒ Grant No. HRD-9805059. One of the authors
͑R.R.R͒ acknowledges the support from the faculty research
program provided by NASA. Research at the University of
Nebraska is supported by NSF-MRSEC, ONR, and CMRA.
1H. Ohno, Science 281, 951 ͑1998͒.
2J. K. Furdyna, J. Appl. Phys. 64, R29-R64 ͑1988͒.
3M. Berciu and R. N. Bhat, Phys. Rev. Lett. 87, 107203 ͑2001͒.
4Y. D. Park, A. T. Hanbicki, S. C. Erwin, C. S. Hellberg, J. M. Sullivan, J.
E. Mattson, T. F. Ambrose, A. Wilson, G. Spanos, and B. T. Jonker,
Science 295, 651 ͑2002͒.
5G. A. Prinz, Science 282, 1660 ͑1998͒.
6S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. von
Molnar, M. L. Rukes, A. Y. Chtchelkanova, and D. M. Treger, Science
294, 1488 ͑2001͒.
7Y. Matsumoto, M. Murakami, T. Shono, T. Hasegawa, T. Fukumura, M.
Kawasaki, P. Ahmet, T. Chikyow, S. Koshihara, and H. Konimura,
Science 291, 854 ͑2001͒.
8S. R. Shinde, S. B. Ogale, S. D. Sarma, J. R. Simpson, H. D. Drew, S. E.
Loafland, C. Lanci, J. P. Biban, N. D. Browning, V. N. Kulkarni, J. Hig-
gins, R. P. Sharma, R. L. Greene, and T. Venkatesan, Phys. Rev. B 67,
115211 ͑2003͒.
9D. H. Kim, J. S. Yang, K. W. Lee, S. D. Bu, T. W. Noh, S. J. Oh, Y. W.
Kim, J. S. Chung, H. Tanaka, H. Y. Lee, and T. Kawai, Appl. Phys. Lett.
81, 2421 ͑2002͒.
10N. J. Seong, Y. G. Yoon, and C. R. Cho, Appl. Phys. Lett. 81, 4209
͑2002͒.
11S. A. Chambers, S. Thevuthasan, R. F. C. Farrow, R. F. Marks, J. U.
Thiele, L. Folks, M. G. Samant, A. J. Kellock, N. Ruzyeki, D. L. Ederer,
and U. Diebold, Appl. Phys. Lett. 79, 3467 ͑2001͒.
12M. Murakami, Y. Matsumoto, K. Nakajima, T. Makino, Y. Segawa, T.
Chikyow, P. Ahmet, M. Kawasaki, and H. Konimura, Appl. Phys. Lett.
78, 2664 ͑2001͒.
13Y. Matsumoto, R. Takahashi, M. Murakami, T. Koida, X. F. Fan, T. Ha-
segawa, T. Fukumura, M. Kawasaki, S. Y. Koshihara, and H. Konimura,
Jpn. J. Appl. Phys., Part 2 40, L1204 ͑2001͒.
14S. Chen, M. G. Mason, H. J. Gysling, G. R. Paz-Pujalt, T. N. Blanton, T.
Castro, K. M. Chen, C. P. Fictorie, W. L. Gladfelter, A. Franciosi, P. I.
Cohen, and J. F. Evans, J. Vac. Sci. Technol. A 11, 2419 ͑1993͒.
15M. L. Cui, J. Zhu, X. Y. Zhong, Y. G. Zhao, and X. F. Duan, Appl. Phys.
Lett. 85, 1698 ͑2004͒.
16V. N. Kulkarni, S. R. Shinde, Y. G. Zhao, R. J. Choudhary, S. B. Ogale, R.
L. Greene, and T. Venkatesan, Nucl. Instrum. Methods Phys. Res. B 219,
tative effects of on magnetization results.
902 ͑2004͒.
130.216.129.208 On: Mon, 08 Dec 2014 21:10:19