Inorganic Chemistry
Article
cooled to the data collection temperature. Data were collected on a
Bruker-AXS APEX CCD diffractometer with graphite-monochromated
Mo−Kα radiation (λ = 0.71073 Å). Unit cell parameters were
obtained from 60 data frames, 0.3° ω, from three different sections of
the Ewald sphere. The systematic absences in the data and the unit cell
parameters were uniquely consistent to Ccca for 1 to P21/c for 2. The
data sets were treated with SADABS absorption corrections based on
redundant multiscan data.20 The structures were solved using direct
methods and refined with full-matrix, least-squares procedures on F2.
The compound molecules were each located on an inversion point in
2. Two symmetry unique but chemically identical molecules of the
compound in 1 are each located on a 2-fold rotation axis: in one case
the 2-fold axis is parallel to the N−Cu−N axis and in the other case
the 2-fold axis is perpendicular to the N−Cu−N axis bisecting the Cu
atoms on the opposite distal positions of the tetracopper rhombus.
One THF solvent molecule of crystallization per two tetrameric
complexes in 1 was located severely disordered and treated as diffused
contribution.21 One isopropyl group in 1 was located disordered with
a 23/77 refined occupancy ratio. Chemically equivalent bond distances
and angles in the disordered group were restrained to average values
with equal atomic displacement atomic parameter contraints on
equivalent atoms. All non-hydrogen atoms were refined with
anisotropic displacement parameters. All hydrogen atoms were treated
as idealized contributions. Atomic scattering factors are contained in
the SHELXTL 6.12 program library.20
Surface Exposure Experiments. The exposure experiments were
performed in a home-built reactor. The reaction chamber consisted of
a stainless steel ring support covered in 200 stainless steel mesh with a
plug of glass wool to prevent loss of silica powder. The system had one
inlet from a heated bubbler and one inlet for He (purity of 99.999%).
All fittings used in this system were either CF or VCR to ensure a
high-vacuum seal. The system was leak checked using a gas thermal
conductivity/leak detector (Gow-Mac Instrument Co.) and an
overpressure of He. For the exposure experiments, typically about 1
g of high surface area SiO2 powder (EP10X; PQ Corporation; 300 m2/
g S.A.; 1.8 cm3/g P.V.; 24 nm P.S.; 100 μm P.D.) was used. The
powder was pretreated in the reactor at 350 °C for 16 h under vacuum
before exposure to the precursor. The reactor and lines were heated to
temperature and allowed to equilibrate for 1−2 h before introduction
of the precursor. The precursor (typically 0.6−0.8 g) was then
vaporized and transported to the substrate with the system under 10−‑3
Torr vacuum. The substrate was exposed to volatilized precursor for
17 h before the system was cooled to room temperature for handling.
Both precursor and substrate were handled in inert atmosphere.
Annealing experiments were performed in a tube furnace while
under vacuum. Samples were loaded into the furnace under a blanket
of nitrogen gas. Samples were annealed for 2 h.
Electron dispersive X-ray spectroscopy (EDX) was performed on
the modified silica samples as qualitative proof for the presence of
copper. Samples were mounted on an aluminum support using carbon
tape and loaded into a Tescan Vega II SEM equipped with an Oxford
Inca 200 EDX for analysis.
AUTHOR INFORMATION
Corresponding Author
■
Notes
The authors declare no competing financial interest.
REFERENCES
■
(1) 2011 Edition of the International Technology Roadmap for
(2) (a) Li, Z.; Rahtu, A.; Gordon, R. G.. J. Electrochem. Soc. 2006, 153,
C787. (b) Li, Z.; Barry, S. T.; Gordon, R. G. Inorg. Chem. 2005, 44,
1728.
(3) Krisyuk, V.; Aloui, L.; Prud’homme, N.; Sysoev, S.; Senocq, F.;
́
Samelor, D.; Vahlas, C. Electrochem. Solid-State Lett. 2011, 14, D26.
(4) (a) Ma, Q.; Guo, H.; Gordon, R. G.; Zaera, F. Chem. Mater. 2010,
22, 352. (b) Ma, Q.; Guo, H.; Gordon, R. G.; Zaera, F. Chem. Mater.
2011, 23, 3325.
(5) Turgambaeva, A.; Prud’homme, N.; Krisyuk, V.; Vahlas, C. J.
Nanosci. Nanotechnol. 2011, 11, 8198.
(6) Coyle, J. P.; Monillas, W. H.; Yap, G. P. A.; Barry, S. T. Inorg.
Chem. 2008, 47, 683.
(7) Coyle, J. P.; Johnson, P. A.; DiLabio, G. A.; Barry, S. T.; Muller, J.
Inorg. Chem. 2010, 49, 2844.
(8) Tsuda, T.; Watanabe, K.; Miyata, K.; Yamamoto, H.; Saegusa, T.
Inorg. Chem. 1981, 20, 2728.
(9) Wasslen, Y. A.; Kurek, A.; Johnson, P. A.; Pigeon, T. C.; Monillas,
W. H.; Yap, G. P. A.; Barry, S. T. Dalton Trans. 2010, 39, 9046.
(10) Coyle, J. P.; Kurek, A.; Pallister, P. J.; Sirianni, E. R.; Yap, G. P.
A.; Barry, S. T. Chem. Commun. 2012, 48, 10440.
(11) Willcocks, A. M.; Robinson, T. P.; Roche, C.; Pugh, T.;
Richards, S. P.; Kingsley, A. J.; Lowe, J. P.; Johnson, A. L. Inorg. Chem.
2012, 51, 246.
(12) Cotton, F. A.; Daniels, L. M.; Feng, X.; Maloney, D. J.; Matonic,
J. H.; Murilio, C. A. Inorg. Chim. Acta 1997, 256, 291.
(13) (a) Abdou, H. E.; Mohamed, A. A.; Fackler, J. P.; Jiang, X.;
Bollinger, J. J. Cluster Sci. 2007, 18, 630. (b) Baik, M.-H.; Lee, D.
Chem. Commun. 2005, 1043. (c) Beck, J.; Strahle, J. Angew. Chem., Int.
̈
Ed. Engl. 1986, 25, 95.
Characterization of Surface Species. Solid-state NMR experi-
ments were performed at 4.7 T on a Bruker Avance III console. All
spectra were obtained using a Bruker 7 mm 1H/X/Y probe. 13C (ν0 =
50.3 MHz) cross-polarization magic angle spinning (CP/MAS)
experiments were collected at a spinning rate of 4.5 kHz using a 3.4
μs 90° proton pulse with a contact time of 2 ms where the contact
(14) Kunte, G. V.; Shivashanker, S. A.; Umarji, A. M. Meas. Sci. Tech.
2008, 19, 025704.
(15) Dai, M.; Kwon, J.; Halls, M. D.; Gordon, R. G.; Chabal, Y. J.
Langmuir 2010, 26, 3911.
(16) Haukka, S.; Lakomaa, E. L.; Root, A. J. Phys. Chem. 1993, 97,
5085.
(17) Wasslen, Y. A.; Tois, E.; Haukka, S.; Kreisel, K. A.; Yap, G. P. A.;
Halls, M. D.; Barry, S. T. Inorg. Chem. 2010, 49, 1976.
(18) Bergna, H. E. The Colloid Chemistry of Silica; American
Chemical Society: Washington, DC, 1994.
(19) Maciel, G. E.; Sindorf, D. W. J. Am. Chem. Soc. 1980, 102, 7606.
(20) Sheldrick, G. M. Acta Crystallogr. 2008, A64, 112.
(21) Spek, A. L. J. Appl. Crystallogr. 2003, 36, 7.
1
pulse was ramped on the H channel. A relaxation delay of 2 s was
sufficient to prevent saturation and typically total acquisition times
were 16−30 h. Glycine was used as an external secondary reference for
the 13C chemical shift scale. Spectra were treated with 40 Hz line
broadening during processing. 29Si (ν0 = 39.7 MHz) CP/MAS
experiments were collected at a spinning rate of 4.5 kHz using a 3.85
μs 90° proton pulse with a contact time of 10 ms where the 1H
channel contact pulse was ramped. The relaxation delay was 2 s and
typically required 2−8 h acquisition times. TMSS was used as an
external reference for the 29Si chemical shift scale. Spectra were treated
with 30 Hz line broadening during processing. All spectra were
obtained with high power proton decoupling during acquisition.
Samples were prepared for High Resolution NMR (HR-NMR) by
adding a small amount, typically 40−50 mg, of modified silica powder
to 2 mL of D2O (Sigma), agitating, and allowed to sit for 15 min. The
D2O solution was then decanted and studied via HR-NMR. d4-TSP
was used as an internal reference.
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dx.doi.org/10.1021/ic3021035 | Inorg. Chem. 2013, 52, 910−917