ARTICLE IN PRESS
F. Deganello et al. / Journal of Solid State Chemistry 179 (2006) 3406–3419
3419
compensate the gradual suppression of oxygen vacancy
concentration induced by Ce. Preliminary EIS results
showed that the lowest ASR has been obtained for the
same cerium content (6 mol%). Oxygen adsorption has
been identified as the rate determining factor of the overall
cathode process in Ce-doped strontium ferrates. All these
findings are important for the application of Ce-doped
SrFeO3 materials in low-temperature oxygen-conducting
devices. Further experiments on the electrochemical
properties of these materials are in progress.
[15] N.E. Trofimenko, H. Ullmann, J. Paulsen, R. Mueller, Solid State
Ionics 99 (1997) 201–214.
[16] R.N. Basu, F. Tietz, E. Wessel, H.P. Buchkremer, D. Stover, Mater.
Res. Bull. 39 (2004) 1335–1345.
[17] S.B. Adler, Chem. Rev. 104 (2004) 4791–4843.
[18] F. Deganello, G. Deganello, unpublished work.
[19] A.C. Larson, R.B. Von Dreele, LANSCE, MS-H 805, Los Alamos
National Laboratory, Los Alamos, NM 87545, USA, 1998.
[20] L.B. McCusker, R.B. Von Dreele, D.E. Coxd, D. Louer, P. Scardi,
J. Appl. Crystallogr. 32 (1999) 36–50.
[21] Y.M. Zhao, M. Hervieu, N. Nguyen, B. Raveau, J. Solid State Chem.
153 (2000) 140–144.
[22] M.P. Seah, in: X. Briggs and X. Seah (Eds.), Practical Surface
Analysis, second ed., vol. 1, Wiley, Chichester, 1990, p. 202.
[23] C.D. Wagner, L.E. Davis, W.M. Riggs, Surf. Interface Anal. 2 (1980)
53–55.
Acknowledgments
The authors are thankful to Prof. G. Deganello for
important suggestions. Moreover the Italian Ministry of
Foreign Affairs (MAE), under the frame of the Italy–Japan
Joint Lab on ‘‘Nanostructured Materials for Environment
and Energy’’ (NaMaTEE), is greatly acknowledged for
supporting the preliminary impedance tests.
[24] S. Brunauer, P.H. Emmet, E. Teller, J. Am. Chem. Soc. 60 (1938)
309–319.
[25] E.P. Barret, L.G. Joyner, P.P. Halenda, J. Am. Chem. Soc. 73 (1951)
373–380.
[26] J.P. Hodges, S. Short, J.D. Jorgensen, X. Xiong, B. Dabrowski, S.M.
Mini, C.W. Kimball, J. Solid State Chem. 151 (2000) 190–209.
[27] J.-F. Huang, X. Ni, J.-C. Bao, J.-H. Wu, Jiegon Huaxue 13 (1994)
350–359.
[28] R.D. Shannon, Acta Crystallogr. A 32 (1976) 751–767.
[29] P.K. Gallagher, J.B. MacChesney, D.N.E. Buchanan, J. Chem. Phys.
41 (1964) 2429–2434;
References
[1] C. Liang, D. Yang, Z. Yang, F. Hou, M. Xu, Surf. Coatings Technol.
200 (2005) 2515–2517.
L. Fournes, Y. Potin, J.C. Grenier, G. Demazeau, M. Pouchard,
Solid State Commun. 62 (1987) 239–244;
[2] V.P.S. Awana, J. Nakamura, J. Linde
´
n, M. Karpinnen, H.
M. Takano, N. Okita, N. Nakayama, Y. Bando, Y. Takeda, O.
Yamamoto, J.B. Goodenough, J. Solid State Chem. 73 (1988)
140–150.
Yamauchi, Solid State Commun, 119 (2001) 159–162.
[3] Y.M. Zhao, X.J. Yang, Y.F. Zheng, D.L. Li, S.Y. Chen, Solid State
Commun. 115 (2000) 365–368.
[30] J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, in: J. Chastain
Jr., R.C. King (Eds.), Handbook of X-ray Photoelectron Spectro-
scopy, Phys. Electronics Inc., Eden Prairie, USA, 1995.
[31] P.A.W. Van der Heide, Surf. Interface Anal. 33 (2002) 414–425.
[32] H. Falcon, J.A. Barbero, J.A. Alonso, M.J. Martinez-Lope, J.L.G.
Fierro, Chem. Mater. 14 (2002) 2325–2333;
[4] S. Zongping, Y. Cong, G. Xiong, S. Sheng, W. Yang, Sci. China
(Series B) 43 (2000) 421–427.
[5] M.T. Colomer, B.C.H. Steele, J.A. Kilner, Solid State Ionics 147
(2002) 41–48.
[6] H. Ullmann, N.E. Trofimenko, F. Tiez, D. Stover, A. Ahmad-
¨
Khanlou, Solid State Ionics 138 (2000) 79–90.
[7] A. Mai, V.A.C. Haanappel, S. Uhlenbruck, F. Tietz, D. Stover, Solid
¨
C.-T. Wang, S.-H. Ro, J. Non-Cryst. Solids 352 (2006) 35–43.
[33] A.P. Grosvenor, B.A. Kobe, M.C. Biesinger, N.S. McIntyre, Surf.
Interface Anal. 36 (2004) 1564–1574.
State Ionics 176 (2005) 1341ꢀ1350.
[8] A.A. Leontiou, A.K. Ladavos, T.V. Bakas, T.C. Vaimakis, P.J.
Pomonis, Appl. Catal. A: Gen. 241 (2003) 143–154.
[9] S. Shin, M. Yonemura, H. Ikawa, Mater. Res. Bull. 13 (1978)
1017–1021.
[34] M.V. Patrakeev, I.A. Leonidov, V.L. Kozhevnikov, V.V. Kharton,
Solid State Sci. 6 (2004) 907–913.
[35] C. Haavik, T. Atake, H. Kawaji, S. Stolen, Phys. Chem. Chem. Phys.
3 (2001) 3863–3870.
[10] M.V. Patrakeev, J.A. Bahteeva, E.B. Mitberg, I.A. Leonidov, V.L.
Kozhevnikov, K.R. Poeppelmeier, J. Solid State Chem. 172 (2003)
219–231.
[36] F. Prado, N. Grunbaum, A. Caneiro, A. Manthiram, Solid State
Ionics 167 (2004) 147–154.
[37] K.V. Pokholok, I.A. Presnyakov, V.A. Ketsko, N.N. Oleinikov, N.T.
Kuznetsov, Russ. J. Coord. Chem. 27 (2001) 632–635.
[38] G. Shirane, E.D. Cox, S.L. Ruby, Phys. Rev. 125 (1962) 1158–1165.
[39] A.M. Venezia, G. Pantaleo, A. Longo, G. Di Carlo, M.P. Casaletto,
L.F. Liotta, G. Deganello, J. Phys. Chem. B 109 (2005) 2821–2827.
[40] R. Spinicci, A. Tofanari, A. Del Mastro, D. Mazza, S. Ronchetti,
Mater. Chem. Phys. 76 (2002) 20–25.
[11] S.E. Dann, D.B. Currie, M.T. Weller, M.F. Thomas, A.D. Al-
Rawwas, J. Solid State Chem. 109 (1994) 134–144.
[12] M. Stange, J. linden, A. kjekshus, N. binsted, M.t. weller, B.c.
hauback, H. fjellvag, J. Solid State Chem. 173 (2003) 148–163.
[13] Y.D. Tretyakov, V.V. Sorokin, A.R. Kaul, A.P. Erastova, J. Solid
State Chem. 18 (1976) 253–261;
H.N. Pandya, R.G. Kulkarni, P.H. Parsania, Mater. Res. Bull. 25
(1990) 1073–1077;
[41] F.J. Berry, J.R. Gancedo, J.F. Marco, X. Ren, J. Solid State Chem.
177 (2004) 2101–2114.
M. Robbins, G.K. Wertheim, A. Menth, R.C. Sherwood, J. Phys.
Chem. Solids 30 (1969) 1823–1825.
[42] M. Wyss, A. Reller, H.R. Oswald, Solid State Ionics 101–103 (1997)
547–554.
[14] N.E. Trofimenko, H. Ullmann, J. Eur. Ceram. Soc. 20 (2000)
1241–1250.
[43] S.E. Dann, M.T. Weller, D.B. Currie, J. Solid State Chem. 97 (1992)
179–185.