R. Kawajiri, T. Mitani and T. Shimoda, J. Am. Chem. Soc., 2005,
127, 17598; (f) L. Song, S.-W. Du, J.-D. Lin, H. Zhou and T. Li,
Cryst. Growth Des., 2007, 7, 2268; (g) Y.-M. Xie, J.-H. Liu,
X.-Y. Wu, Z.-G. Zhao, Q.-S. Zhang, F. Wang, S.-C. Chen and
C.-Z. Lu, Cryst. Growth Des., 2008, 8, 3914.
5 (a) G. Rijnders and D. H. V. Blank, Nature, 2005, 433, 369; (b)
H. N. Lee, H. M. Christen, M. F. Chisholm, C. M. Rouleau and
D. H. Lowndes, Nature, 2005, 433, 395; (c) C. C. Homes, T. Vogt,
S. M. Shapiro, S. Wakimoto and A. P. Ramirez, Science, 2001, 293,
673; (d) J. Valasek, Phys. Rev., 1921, 17, 475.
substituents from –Br to –Cl and then –NO2, the Ps values or the
ferroelectric properties gradually increased. It can be predicted
that these properties can be further improved by replacing the
substituents with groups with higher electron-withdrawing
properties, such as –F, –CF3 etc. or with multiple electron-
withdrawing groups. Further studies on the improvement of the
ferroelectricity of pure organic compounds are still under way in
our laboratory.
6 (a) S. Horiuchi and Y. Tokura, Nat. Mater., 2008, 7, 357; (b)
R. Kumai, S. Horiuchi, Y. Okimoto and Y. Tokura, J. Chem.
Phys., 2006, 125, 084715; (c) S. Horiuchi, R. Kumai and Y. Tokura,
Angew. Chem., Int. Ed., 2007, 46, 3497; (d) S. Horiuchi, R. Kumai
and Y. Tokura, J. Am. Chem. Soc., 2005, 127, 5010; (e) E. Collet,
M.-H. Lemee-Cailleau, M. Buron-Le Cointe, H. Cailleau,
M. Wulff, T. Luty, S.-Y. Koshihara, M. Meyer, L. Youpet,
P. Rabiller and S. Techert, Science, 2003, 300, 612; (f) R. Kumai,
S. Horiuchi, H. Sagayama, T. H. Arima, M. Watanabe, Y. Noda
and Y. Tokura, J. Am. Chem. Soc., 2007, 129, 12920.
Acknowledgements
This work was supported by China Postdoctoral Science Foun-
dation (20090451189), Natural Science Foundation of Jiangxi
Province (2007GZH1667), Department of Education of Jiangxi
Province (Grant GJJ10536) and Open Funds of State Key
Laboratory of Coordination Chemistry of Nanjing University.
7 (a) S. Horiuchi, R. Kumai and Y. Tokura, Chem. Commun., 2007,
2321; (b) K. Noda, I. Kenji, K. Atsushi, H. Toshihisa, Y. Hirofumi
and M. Kazumi, J. Appl. Phys., 2003, 93, 2866.
References
1 (a) I. I. Naumov and H. Fu, Phys. Rev. Lett., 2005, 95, 247602; (b)
I. I. Naumov, L. Bellaiche and H. Fu, Nature, 2004, 432, 737; (c)
C. H. Ahn, K. M. Rabe and J. M. Triscone, Science, 2004, 303,
488; (d) J. Junquera and P. Ghosez, Nature, 2003, 422, 506; (e)
H. Fu and L. Bellaiche, Phys. Rev. Lett., 2003, 91, 257601; (f)
K. E. Maly, M. D. Wand and R. P. Lemieux, J. Am. Chem. Soc.,
2002, 124, 7898; (g) R. P. Lemieux, Acc. Chem. Res., 2001, 34, 845;
(h) J. F. Scott, Ferroelectric Memories, Springer, New York, 2000;
(i) O. Auciello, J. F. Scott and R. Ramesh, Phys. Today, 1998, 51, 22.
2 J. Valasek, Phys. Rev., 1920, 15, 537.
3 (a) R. C. G. Naber, K. Asadi, P. W. M. Blom, D. M. Leeuw and
B. Boer, Adv. Mater., 2010, 22, 933; (b) X.-Q. Liang, D.-P. Li,
C.-H. Li, X.-H. Zhou, Y.-Z. Li, J.-L. Zuo and X.-Z. You, Cryst.
Growth Des., 2010, 10, 2596; (c) W. Zhang, H.-Y. Ye, H.-L. Cai,
J.-Z. Ge, R.-G. Xiong and S. D. Huang, J. Am. Chem. Soc., 2010,
132, 7300.
8 Y. Sui, D.-P. Li, C.-H. Li, X.-H. Zhou, T. Wu and X.-Z. You, Inorg.
Chem., 2010, 49, 1286.
9 (a) H. Danner and R. Braun, Chem. Soc. Rev., 1999, 28, 395; (b)
F. A. San, M. Gordaliza, M. A. Salinero and J. M. Miguel del
Corral, Planta Med., 1993, 59, 485.
10 W. J. Gottstein and L. C. Cheney, J. Org. Chem., 1965, 30, 2072.
11 G. M. Sheldrick, SADABS 2.05, University of Gottingen.
12 SHELXTL 6.10, Bruker Analytical Instrumentation, Madison,
Wisconsin, USA, 2000.
13 X.-P. Rao, Z.-Q. Song, Y. Gong, X.-J. Yao and S.-B. Shang, Acta
Crystallogr., Sect. E, 2006, E62, o3450.
14 S. K. Kurtz and T. T. Perry, J. Appl. Phys., 1968, 39, 3798.
15 (a) X. L. Li, K. Chen, Y. Liu, Z. X. Wang, T. W. Wang, J. L. Zuo,
Y. Z. Li, Y. Wang, J. S. Zhu, J. M. Liu, Y. Song and X. Z. You,
Angew. Chem., Int. Ed., 2007, 46, 6820; (b) W. Zhang, H.-Y. Ye
and R.-G. Xiong, Coord. Chem. Rev., 2009, 253, 2980.
4 (a) T. Okubo, R. Kawajiri, T. Mitani and T. Shimoda, J. Am. Chem.
Soc., 2005, 127, 17598; (b) S. Horiuch, R. J. Kumai and Y. Tokuar,
J. Am. Chem. Soc., 2005, 127, 5010; (c) S. Ohkoshi, H. Tokoro,
T. Matsuda, H. Takahashi, H. Irie and K. Hashimoto, Angew.
Chem., Int. Ed., 2007, 46, 3238; (d) K. Nakagawa, H. Tokoro and
S. Ohkoshi, Inorg. Chem., 2008, 47, 10810; (e) T. Okubo,
16 Q. H. Zhang, Y. Y. Zhang, F. F. Wang, Y. J. Wang, D. Lin,
X. Y. Zhao, H. S. Luo, W. W. Ge and D. Viehland, Appl. Phys.
Lett., 2009, 95, 102904.
17 T. Scholz, B. Mihailova, G. A. Schneider, N. Pagels, J. Heck,
T. Malcherek, R. P. Fernandes, V. Marinova, M. Gospodinov and
U. Bismayer, J. Appl. Phys., 2009, 106, 074108.
This journal is ª The Royal Society of Chemistry 2011
J. Mater. Chem., 2011, 21, 14599–14603 | 14603