Chemistry of Materials
Article
CH NH PbI and prepared for 24 h after their synthesis. Also, in all
our experiments with either commercial SA or mechanochemical
MC2, solution concentrations were calculated based on the false
measurements of powders were taken using a zero-background holder
made of monocrystalline silicon.
3
3
3
SEM Images and EDS Analysis. Scanning electron microscopy
(SEM) images and energy-dispersive spectroscopy (point or full
image) elemental analysis were obtained using a JSM-6010LA (JEOL)
at accelerating voltages 12 and 15 kV, respectively. Low-voltage
scanning electron microscopy images were obtained using a FEI
Helios NanoLab G3 UC SEM at an accelerating voltage of 2 kV using
a through-lens detector (TLD) at a working distance of 4.2 mm and
with a beam current of 13 pA.
assumption of stoichiometrically perfect PbI (Pb:I = 1:2, atom ratio),
2
−
1
with a molecular weight of 461.01 g·mol .
Device Fabrication. Glass substrates pre-patterned with six ITO
indium tin oxide) pixels (20 Ω/square, Ossila) were first sonicated
(
for 10 min in a solution made of 1 mL of detergent (Hellmanex III)
and 250 mL of boiled deionized water (100 °C). Any residual
detergent was subsequently washed off by rinsing the substrates three
times with 100 mL (each time) of deionized water. The glass/ITO
substrates were further sonicated two more times for 10 min (each
time) in 250 mL of acetone and then 250 mL of isopropanol. The
cleaned substrates were then treated with oxygen plasma for 10 min to
remove organic contaminants. Clean glass/ITO substrates were
transferred into a cleanroom (class 1000) with a constant temperature
of 20 °C and humidity of 30% for deposition of the electron
transporting layer and perovskite thin film. A colloidal dispersion of
Visible−Infrared (Vis-IR) Spectroscopy Measurements.
Absorption spectra of all CH NH PbI thin films were obtained
3
3
3
using a spectrometer (USB2000 + UV−VIS-ES) equipped with a
deuterium halogen light source (UV−VIS-NIR_DT-MINI-2-GS),
both from Ocean Optics.
Time-Resolved Photoluminescence (TRPL) Measurements.
The time-resolved photoluminescence measurements were performed
using the time-correlated single photon counting (TCSPC) method
tin(IV) oxide (SnO ) in deionized water (15%, Alfa Aesar, diluted to
2
3
%) was spin coated at 3000 rpm for 30 s followed by removal of
(FluoTime 200, Picoquant) under magic-angle conditions. Excitation
SnO from part of the substrate using a cotton bud, re-exposing the
2
was performed by a pulsed diode laser at 470 nm, and the
instrument’s response function (IRF) was ∼80 ps. Multi-exponential
functions convoluted with the IRF were used for the fitting taking into
∼
4−5 mm ITO electrode. The coated substrates were then annealed
at 150 °C for 30 min and cooled down to 20 °C, without any further
59
treatment. Fifty microliters of the perovskite solutions made of
either CH NH PbI microcrystals in DMSO with a concentration of
2
account that the χ factor should be smaller than 1.1.
3
3
3
X-ray Photoelectron Spectroscopy (XPS) Measurements.
Each powder was mounted for analysis by pushing the powder into
indium foil. The indium foil was then mounted directly onto the
sample holder using double-sided conducting carbon tape. The
analyses were carried out using a Kratos Supra instrument with a
monochromatic aluminum source and an energy of 1486.69 eV.
Survey scans were collected between binding energies from 1200 to 0
eV at 1 eV intervals with an acquisition time of 10 min (per point)
from two analysis points per sample. High-resolution scans were also
collected for the I 3d, O 1s, C 1s, and Pb 4f core levels at 0.1 eV
intervals with an acquisition time of 5 min for each point. The data
collected were calibrated in intensity using a transmission function
characteristic of the instrument to make the values instrument-
independent. The data was then quantified using the CasaXPS
software, determining the transmission functions as provided by the
National Physical Laboratory (NPL). Binding energy calibrations for
all survey or high-resolution scans were conducted with respect to the
Pb 4f 7/2 core level at 138.0 eV. No selected option as an escape
depth correction was applied at each survey or high-resolution scan
1
.13 M or solutions of (almost stoichiometric MC2 or substoichio-
metric SA) PbI reacted with equimolar amounts of CH NH I in
DMSO with a concentration of 2.8 M was statically dispersed onto
the glass/ITO/SnO samples followed by spin coating at 2500 or
2
3
3
2
3
100 rpm for 10 s, respectively. Each substrate was placed in a
mbar, as shown in Figure S15. Then, each substrate was annealed on a
hot plate at 100 °C for 30 s. All glass/ITO/SnO /CH NH PbI
2
3
3
3
samples were then transferred inside a nitrogen-filled glove box for the
synthesis and deposition of the doped hole transporting layer of
2
,2′,7,7′-tetrakis[N,N-di(4-methoxyphenyl)amino]-9,9′-spirobifluor-
ene (spiro-OMeTAD, ≥99.5%, Ossila). An 86.6 mg solution of spiro-
OMeTAD powder was dissolved in 1 mL of chlorobenzene. The
solution was then doped with lithium bis(trifluoromethanesulfonyl)-
imide (Li-TFSI, ≥99%, Sigma-Aldrich), 4-tert-butylpyridine (TBP
9
6.6%, Sigma-Aldrich), and FK209 (FK 209 Co(II) PF6, Greatcell).
The quantity of dopants used in 1 mL of the spiro-OMeTAD/
chlorobenzene solution was as follows: 20 μL of Li-TFSI (500 mg·
mL in acetonitrile), 34 μL of TBP, and 11 μL of FK209 (300 mg·
−1
−1
mL in acetonitrile). The solution was filtered with a PTFE filter
pore size of 0.2 μm), and then 50 μL was spin coated on each sample
(
61
before starting any further quantification analysis. For the
dynamically at 4000 rpm for 30 s. Devices were left overnight in dry
air to allow for spiro-OMeTAD to be oxidized. Finally, 80 nm of gold
was deposited in an Edwards thermal evaporator, with a deposition
rate of 0.1 Å s for the first 2 nm and then 1 Å s for the remaining
thickness. All un-encapsulated PSCs devices were immediately
characterized electrically.
compositional analysis of the core level spectra of I 3d 5/2, O 1s,
C 1s, and Pb 4f 7/2, the Scofield relative sensitivity factors of 16, 2.52,
1, and 13.7 were used, respectively. The binding energy regions used
for analysis were kept constant with respect to each element at each
survey or high-resolution scan. Also, for each binding energy region, a
Shirley type background function was used.
−
1
−1
60
Photocurrent Density−Voltage (J−V) Measurements. Photo-
current density−voltage (J−V) characteristics were measured under
an AM 1.5G light (1000 W m ) produced by a xenon lamp
Rutherford Backscattering Spectroscopy (RBS) Measure-
−
2
ments. Two commercial and four synthesized PbI samples in the
2
(
Newport solar simulator). The light intensity was calibrated using a
form of pellets with a diameter of ∼13 mm and thickness of ∼1.5 mm
were prepared using a press under an applied mass of 9 tons. For the
RBS measurements, a 1.7 MV Tandetron RBS linear type tandem ion
beam accelerator was used, which is located in the Laboratory of Ion
silicon reference cell (Newport). Each solar cell device was mounted
and covered with a six-pixelated cell shadow mask, with an aperture
2
area of 0.0256 cm per cell. Cells were scanned from −0.2 to 1.2 V
−
1
and then back to −0.2 V at a scan step of 0.01 V·s using a Keithley
Beam Physics at the ETH Zurich facilities in Switzerland. PbI pellets
2
2
37 source measure unit.
Powder X-ray Diffraction Measurements. X-ray diffraction
4
+
were bombarded with accelerated ions of He at 2 MeV, while a PIN
diode detector was placed at an angle of 168°, with respect to the
beam of incident ions. The resulted data were plotted using the
RUMP simulation software.
patterns of all (commercial (used as received and stored in dark
conditions), hydrothermal, and mechanochemical) lead iodide
powders and CH NH PbI microcrystals were obtained using a D2
Phaser (Bruker) diffractometer under monochromatic Cu Kα
radiation (λ = 1.54184 Å) and step size 2θ = 0.020273° over the
2
3
3
3
Atomic Force Microscopy (AFM) Measurements. Atomic
force microscopy of the CH NH PbI thin films was performed using
3
3
3
a Dimension icon with ScanAsyst AFM (Bruker) with a cantilever
θ range from 9° to 52°. X-ray diffraction patterns of CH NH PbI
3 3 3
microcrystals with different amounts of excess CH NH I were
obtained at double acquisition time for higher accuracy. Also, all
consisting of a silicon tip on a silicon nitride lever (Bruker) (f = 70
3
3
−
1
kHz, k = 0.4 N·m ).
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Chem. Mater. 2021, 33, 554−566